HCTS244MS Datasheet, PDF (5/10 Pages) Intersil Corporation – Radiation Hardened Octal Buffer/Line Driver, Three-State

Specifications HCTS244MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
Quiescent Current
ICC
VCC = 5.5V, VIN = VCC or GND
Output Current (Sink)
IOL
VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
Output Current
(Source)
IOH
VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
Output Voltage Low
VOL
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.8V, IOL = 50µA
Output Voltage High
VOH
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.8V, IOH = -50µA
Three-State Output
Leakage Current
IOZ
Applied Voltage = 0V or VCC, VCC = 5.5V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, (Note 3)
Propagation Delay Data
to Output
TPLH
VCC = 4.5V
Data to Output
TPHL VCC = 4.5V
Enable to Output
TPZL VCC = 4.5V
Enable to Output
TPZH VCC = 4.5V
Disable to Output
TPLZ,
TPHZ
VCC = 4.5V
TEMPERATURE
+25^oC
+25^oC
200K RAD
LIMITS
MIN MAX UNITS
-
0.75
mA
6.0
-
mA
+25^oC
-6.0
-
mA
+25^oC
-
0.1
V
+25^oC
+25^oC
VCC
-
V
-0.1
-
±50
µA
+25^oC
+25^oC
-
±5
µA
-
-
-
+25^oC
2
20
ns
+25^oC
+25^oC
+25^oC
+25^oC
2
26
2
32
ns
2
25
ns
2
25
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25^oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12µA
IOL/IOH
5
-15% of 0 Hour
IOZL/IOZH
5
±200nA
Spec Number 518616
606