HCS154MS_11 Datasheet, PDF (5/8 Pages) Intersil Corporation – Radiation Hardened 4 to 16 Line Decoder/Demultiplexer

HCS154MS
ICC
IOL/IOH
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25°C)
PARAMETER
GROUP B SUBGROUP
DELTA LIMIT
5
12μA
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 8)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Subgroups 1, 2, 3, 9, 10, 11
Deltas
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
8. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD PRE RAD
TEST
POST RAD
READ AND RECORD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
See “DC Post Radiation
Electrical Performance
Characteristics” table on page 4
1, 9
See “DC Post Radiation Electrical
Performance Characteristics” table
on page 4 (Note 9)
NOTE:
9. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 10)
1 - 11, 13 - 17
12, 18 - 23
-
24
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 10)
1 - 11, 13 - 17
12
-
18 - 24
-
-
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 11)
-
12, 18 - 21
1 - 11, 13 - 17
24
23
22
NOTES:
10. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in.
11. Each pin except VCC and GND will have a resistor of 1kΩ ± 5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
1 - 11, 13 - 17
12
18 - 24
NOTE: Each pin except VCC and GND will have a resistor of 47kΩ ± 5% for irradiation testing. Group E, Subgroup 2, sample size
is 4 dice/wafer 0 failures.
5
FN2479.3
January 6, 2011