CD4069UBMS Datasheet, PDF (5/8 Pages) Intersil Corporation – CMOS Hex Inverter

Specifications CD4069UBMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
Static Burn-In 1
(Note 1)
OPEN
GROUND
2, 4, 6, 8, 10, 12 1, 3, 5, 7, 9, 11,
13
VDD
14
9V ± -0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 2
(Note 1)
2, 4, 6, 8, 10, 12
7
1, 3, 5, 9, 11, 13,
14
Dynamic Burn-In
(Note 1)
-
7
14
2, 4, 6, 8, 10, 12 1, 3, 5, 9, 11, 13
Irradiation
(Note 2)
2, 4, 6, 8, 10, 12
7
1, 3, 5, 9, 11, 13,
14
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
Typical Performance Characteristics
AMBIENT TEMPERATURE (T_A) = +25^oC
SUPPLY VOLTAGE
(VDD) = 15V
15.0
VI
VO
12.5
10V
10.0
7.5
5V
5.0
2.5
17.5
15.0
SUPPLY VOLTAGE
(VDD) = 15V
12.5
10V
10.0
+125^oC
7.5
-55^oC
AMBIENT
= +125^oC
TEMPERATURE
(T_A)
-55^oC
5.0 ^{5V -55oC}
2.5
0
2.5
5.0 7.5
10.0 12.5 15.0
INPUT VOLTAGE (VI) (V)
0 2.5 5.0 7.5 10.0 12.5 15.0 17.5 20.0
INPUT VOLTAGE (VI) (V)
FIGURE 2. MINIMUM AND MAXIMUM VOLTAGE TRANSFER
CHARACTERISTICS
FIGURE 3. TYPICAL VOLTAGE TRANSFER CHARACTERIS-
TICS AS A FUNCTION OF TEMPERATURE
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