CD4048BMS Datasheet, PDF (5/11 Pages) Intersil Corporation – CMOS Multifunction Expandable 8 Input Gate

Specifications CD4048BMS
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25^OC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - SSI
Output Current (Sink)
Output Current (Source)
IDD
IOL5
IOH5A
±0.1µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
Static Burn-In 1
Note 1
OPEN
1
GROUND
2 - 15
VDD
16
9V ± -0.5V
50kHz
25kHz
Static Burn-In 2
1
Note 1
8
2 - 7, 9 - 16
Dynamic Burn-
-
In Note 1
8, 15
2, 16
1
9 - 14
3-7
Irradiation
1
Note 2
8
2 - 7, 9 - 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
7-916