CD4043BMS Datasheet, PDF (5/10 Pages) Intersil Corporation – CMOS Quad Clocked “D” Latch

Specifications CD4043BMS, CD4044BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
PART NUMBER CD4043BMS
Static Burn-In 1 1, 2, 9, 10, 13 3 - 8, 11, 12, 14,
16
Note 1
15
Static Burn-In 2 1, 2, 9, 10, 13
8
Note 1
3 - 7, 11, 12,
14 - 16
Dynamic Burn-
13
In Note 1
8
5, 16
1, 2, 9, 12
4, 6, 12, 14
3, 7, 11, 15
Irradiation
1, 2, 9, 10, 13
8
Note 2
3 - 7, 11, 12,
14 - 16
PART NUMBER CD4044BMS
Static Burn-In 1 1, 2, 9, 10, 13 3 - 8, 11, 12, 14,
16
Note 1
15
Static Burn-In 2 1, 2, 9, 10, 13
8
Note 1
3 - 7, 11, 12,
14 - 16
Dynamic Burn-
2
In Note 1
8
5, 16
1, 9, 10, 13
4, 6, 12, 14
3, 7, 11, 15
Irradiation
1, 2, 9, 10, 13
8
Note 2
3 - 7, 11, 12,
14 - 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V ± 0.5V
7-880