ISL28127_10 Datasheet, PDF (4/23 Pages) Intersil Corporation – Precision Single and Dual Low Noise Operational Amplifiers

ISL28127, ISL28227
Absolute Maximum Ratings
Maximum Supply Voltage . . . . . . . . . . . . . . . . . . . . . . 42V
Maximum Differential Input Current . . . . . . . . . . . . . 20mA
Maximum Differential Input Voltage . . . . . . . . . . . . . . .0.5V
Min/Max Input Voltage . . . . . . . . . . . V- - 0.5V to V+ + 0.5V
Max/Min Input Current for
Input Voltage >V+ or <V- . . . . . . . . . . . . . . . . . . ±20mA
Output Short-Circuit Duration
(1 Output at a Time) . . . . . . . . . . . . . . . . . . . . Indefinite
ESD Tolerance
Human Body Model (Tested per JESD22-A114F)
ISL28127. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.0kV
ISL28227. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.0kV
Machine Model (Tested per EIA/JESD22-A115-A) . . . . 500V
Charged Device Model (Tested per JESD22-C101D) . . 1.5kV
Di-electrically Isolated PR40 process. . . . . . . . Latch-up free
Thermal Information
Thermal Resistance (Typical)
θ_JA (°C/W) θ_JC (°C/W)
8 Ld SOIC (Note 5, 7)
ISL28127 . . . . . . . . . . . . . . . . . 120
60
ISL28227 . . . . . . . . . . . . . . . . . 110
55
8 Ld TDFN (Notes 5, 6)
ISL28127 . . . . . . . . . . . . . . . . . 48
7
ISL28227 . . . . . . . . . . . . . . . . . 47
6
8 Ld MSOP (Note 5, 7)
ISL28127 . . . . . . . . . . . . . . . . . 155
50
ISL28227 . . . . . . . . . . . . . . . . . 150
45
Storage Temperature Range . . . . . . . . . . . -65°C to +150°C
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Operating Conditions
Ambient Operating Temperature Range . . . -40°C to +125°C
Maximum Operating Junction Temperature . . . . . . . +150°C
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact
product reliability and result in failures not covered by warranty.
NOTES:
5. θ_JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief
TB379 for details.
6. For θ_JC, the “case temp” location is the center of the exposed metal pad on the package underside.
7. For θ_JC, the “case temp” location is taken at the package top center.
IMPORTANT NOTE: All parameters having Min/Max specifications are guaranteed. Typical values are for information purposes only. Unless
otherwise noted, all tests are at the specified temperature and are pulsed tests, therefore: T_J = T_C = T_A
Electrical Specifications V_S ±15V, V_CM = 0, V_O = 0V, R_L = Open, T_A= +25°C, unless otherwise noted. Boldface limits
apply over the operating temperature range, -40°C to +125°C. Temperature data
established by characterization.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
(Note 8)
TYP
MAX
(Note 8)
UNIT
V_OS
Offset Voltage; SOIC Package ISL28127
-70
10
70
µV
-120
-
120
µV
ISL28227
-75
10
75
µV
-150
-
150
µV
Offset Voltage;
ISL28127
MSOP, TDFN Grade C Package ISL28227
-150
10
150
µV
-250
-
250
µV
TCV_OS
I_OS
Offset Voltage Drift;
SOIC Pacakge
Offset Voltage Drift;
MSOP, TDFN, Grade C
Input Offset Current
ISL28127
ISL28227
ISL28127
ISL28227
I_B
Input Bias Current
V_CM
Input Voltage Range
Guaranteed by CMRR
CMRR
Common-Mode Rejection Ratio
V_CM = -13V to +13V
V_CM = -12V to +12V
-0.5
0.1
-0.75
0.1
-1
0.1
-10
1
-12
-
-10
1
-12
-
-13
-
-12
-
115
120
115
-
0.5
0.75
1
10
12
10
12
13
12
-
-
µV/°C
µV/°C
µV/°C
nA
nA
nA
nA
V
V
dB
dB
4
FN6633.3
March 18, 2010