HCTS14MS Datasheet, PDF (4/8 Pages) Intersil Corporation – Radiation Hardened HEX Inverting Schmitt Trigger

Specifications HCTS14MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
Output Voltage High
VOH
VCC = 4.5V and 5.5V,
VIH = VCC/2,
VIL = 0.4V at 200K RAD,
IOH = -50µA
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
Noise Immunity Functional Test
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.4V at 200K RAD, (Note 3)
Propagation Delay
TPHL VCC = 4.5V
TPLH VCC = 4.5V
Input Switch Points
VT+
VCC = 4.5
VT-
VCC = 4.5
VH
VCC = 4.5
TEMPERATURE
+25^oC
200K RAD LIMITS
MIN MAX UNITS
VCC
-
V
-0.1
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
-
±5
µA
-
-
-
2
21
ns
2
31
ns
0.40 2.25
V
0.40 2.25
V
0.10 1.40
V
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25^oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
3µA
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
GROUP A SUBGROUPS
CONFORMANCE GROUPS
MIL-STD-883 METHOD
TESTED FOR -Q
RECORDED FOR -Q
Initial Test
100% 5004
1, 7, 9
1 (Note 2)
Interim Test
100% 5004
1, 7, 9, ∆
1, ∆ (Note 2)
PDA
100% 5004
1, 7, ∆
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Subgroup B5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, ∆
1, 2, 3, ∆ (Note 2)
Subgroup B6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with MIL-STD-883 Method 5005 may be exercised.
2. Table 5 parameters only.
Spec Number 518607
393