HCTS08MS Datasheet, PDF (4/10 Pages) Intersil Corporation – Radiation Hardened Quad 2-Input AND Gate

Specifications HCTS08MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETERS
Noise Immunity
Functional Test
Input to Output
SYMBOL
(NOTES 1, 2)
CONDITIONS
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V at 200K RAD, (Note 3)
TPHL VCC = 4.5V
TPLH VCC = 4.5V
TEMPERATURE
+25^oC
200K RAD LIMITS
MIN MAX UNITS
-
-
-
+25^oC
+25^oC
2
20
ns
2
22
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25^oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
3µA
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
GROUP A SUBGROUPS
COMFORMANCE GROUP
MIL-STD-883 METHOD
TESTED
RECORDED
Initial Test
100% 5004
1, 7, 9
1 (Note 2)
Interim Test
100% 5004
1, 7, 9, ∆
1, ∆ (Note 2)
PDA
100% 5004
1, 7, ∆
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Subgroup B5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, ∆
1, 2, 3, ∆ (Note 2)
Subgroup B6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with MIL-STD-883 Method 5005 may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
Spec Number 518842
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