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DG444 Datasheet, PDF (4/10 Pages) Intersil Corporation – Monolithic, Quad SPST, CMOS Analog Switches
◁
DG444, DG445
Electrical Specifications Test Conditions: V+ = +15V, V- = -15V, VL = 5V, VIN = 2.4V, 0.8V (Note 3),
Unless Otherwise Specified (Continued)
PARAMETER
TEST CONDITIONS
TEMP
(oC)
(NOTE 4) (NOTE 5)
MIN
TYP
Drain OFF Leakage Current,
ID(OFF)
V+ = 16.5V, V- = -16.5V,
VD = ±15.5V, VS = 15.5V
25
-0.5
0.01
85
-5
-
Channel ON Leakage Current,
ID(ON) + IS(ON)
V+ = 16.5V, V- = -16.5V,
VS = VD, = ±15.5V
25
-0.5
0.08
85
-10
-
POWER SUPPLY CHARACTERISTICS
Positive Supply Current, I+
V+ = 16.5V, V- = -16.5V,
VIN = 0V or 5V
25
-
0.001
85
-
-
Negative Supply Current, I-
25
-1
-0.0001
85
-5
-
Logic Supply Current, IL
25
-
0.001
85
-
-
Ground Current, IGND
25
-1
-0.001
85
-5
-
(NOTE 4)
MAX
0.5
5
0.5
10
1
5
-
-
1
5
-
-
UNITS
nA
nA
nA
nA
µA
µA
µA
µA
µA
µA
µA
µA
Electrical Specifications (Single Supply) Test Conditions: V+ = 12V, V- = 0V, VL = 5V, VIN = 2.4V, 0.8V (Note 3),
Unless Otherwise Specified
PARAMETER
TEST CONDITIONS
TEMP
(oC)
(NOTE 4) (NOTE 5) (NOTE 4)
MIN
TYP
MAX
UNITS
DYNAMIC CHARACTERISTICS
Turn-ON Time, tON
Turn-OFF Time, tOFF
RL = 1kΩ, CL = 35pF, VS = 8V
25
(Figure 1)
25
Charge Injection, Q (Figure 2)
CL = 1nF, VG = 6V, RG = 0Ω
25
ANALOG SWITCH CHARACTERISTICS
-
300
450
ns
-
60
200
ns
-
2
-
pC
Analog Signal Range, VANALOG
Drain-Source ON Resistance, rDS(ON)
IS = -10mA, VD = 3V, 8V
V+ = 10.8V, VL = 5.25V
Full
0
-
12
V
25
-
100
160
Ω
Full
-
-
200
Ω
POWER SUPPLY CHARACTERISTICS
Positive Supply Current, I+
V+ = 13.2V, VIN = 0V or 5V,
VL = 5.25V
25
-
0.001
1
µA
Full
-
-
5
µA
Negative Supply Current, I-
25
-1
-0.0001
-
µA
Full
-5
-
-
µA
Logic Supply Current, IL
25
-
0.001
1
µA
Full
-
-
5
µA
Ground Current, IGND
25
-1
-0.001
-
µA
Full
-5
-
-
µA
NOTES:
3. VIN = input voltage to perform proper function.
4. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
5. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
4
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