CD4585BMS Datasheet, PDF (4/8 Pages) Intersil Corporation – CMOS 4-Bit Magnitude Comparator

Specifications CD4585BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
SYMBOL
CONDITIONS
Propagation Delay
Comparing Inputs to
Outputs
TPHL1 VDD = 10V
TPLH1 _{VDD = 15V}
Propagation Delay
Cascading Inputs to Out-
puts
TPHL2 VDD = 10V
TPLH2 _{VDD = 15V}
Transition Time
TTHL
TTLH
VDD = 10V
VDD = 15V
Input Capacitance
CIN Any Inputs
NOTES
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
TEMPERATURE MIN
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
MAX
250
160
UNITS
ns
ns
160
ns
120
ns
100
ns
80
ns
7.5
pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
Propagation Delay Time
SYMBOL
CONDITIONS
IDD VDD = 20V, VIN = VDD or GND
VNTH VDD = 10V, ISS = -10µA
∆VTN VDD = 10V, ISS = -10µA
VTP
∆VTP
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
F
TPHL
TPLH
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
VDD = 5V
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE MIN
+25^oC
-
+25^oC
-2.8
+25^oC
-
1, 4
+25^oC
0.2
1, 4
+25^oC
-
1
1, 2, 3, 4
+25^oC
+25^oC
VOH >
VDD/2
-
3. See Table 2 for +25^oC limit.
4. Read and Record
MAX
25
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25^oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25^oC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
IDD
IOL5
IOH5A
± 1.0µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
Interim Test 3 (Post Burn-In)
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
100% 5004
1, 7, 9
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
7-1262