CD4068BMS Datasheet, PDF (4/8 Pages) Intersil Corporation – CMOS 8 Input NAND/AND Gate

Specifications CD4068BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Input Voltage High
Propagation Delay
Transition Time
Input Capacitance
SYMBOL
CONDITIONS
VIH VDD = 10V, VOH > 9V, VOL <
1V
TPHL
TPLH
VDD = 10V
VDD = 15V
TTHL VDD = 10V
VDD = 15V
CIN Any Input
NOTES
1, 2
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
TEMPERATURE MIN
+25^oC, +125^oC,
7
-55^oC
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
MAX
-
UNITS
V
150
ns
110
ns
100
ns
80
ns
7.5
pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
SYMBOL
CONDITIONS
Supply Current
IDD VDD = 20V, VIN = VDD or GND
N Threshold Voltage
VNTH VDD = 10V, ISS = -10µA
N Threshold Voltage
Delta
∆VTN VDD = 10V, ISS = -10µA
P Threshold Voltage
VTP VSS = 0V, IDD = 10µA
P Threshold Voltage
Delta
∆VTP VSS = 0V, IDD = 10µA
Functional
F
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL VDD = 5V
TPLH
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE MIN
+25^oC
-
+25^oC
-2.8
+25^oC
-
1, 4
+25^oC
0.2
1, 4
+25^oC
-
1
1, 2, 3, 4
+25^oC
+25^oC
VOH >
VDD/2
-
3. See Table 2 for +25^oC limit.
4. Read and Record
MAX
2.5
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25^oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25^OC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - SSI
IDD
±0.1µA
Output Current (Sink)
IOL5
± 20% x Pre-Test Reading
Output Current (Source)
IOH5A
± 20% x Pre-Test Reading
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
100% 5004
1, 7, 9
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
7-988