HCTS138MS_05 Datasheet, PDF (3/9 Pages) Intersil Corporation – Radiation Hardened Inverting 3-to-8 Line Decoder/Demultiplexer

Specifications HCTS138MS
Absolute Maximum Ratings
Reliability Information
Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . . -0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . . ±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . . ±25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . -65^oC to +150^oC
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . .+265^oC
Junction Temperature (TJ). . . . . . . . . . . . . . . . . . . . . . . . . . .+175^oC
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance
θ_JA
θ_JC
SBDIP Package . . . . . . . . . . . . . . . . . . . . 73^oC/W 24^oC/W
Ceramic Flatpack Package . . . . . . . . . . . 114^oC/W 29^oC/W
Maximum Package Power Dissipation at +125^oC Ambient
SBDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . .0.44W
If device power exceeds package dissipation capability, provide
heat sinking or derate linearly at the following rate:
SBDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13.7mW/^oC
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . .8.8mW/^oC
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent dam-
age. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed under “Electri-
cal Performance Characteristics” are the only conditions recommended for satisfactory device operation..
Operating Conditions
Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at VCC = 4.5V (TR, TF) . . . . . 500ns Max
Operating Temperature Range (T_A) . . . . . . . . . . . -55^oC to +125^oC
Input Low Voltage (VIL) . . . . . . . . . . . . . . . . . . . . . . . . . 0.0V to 0.8V
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . . . . VCC/2 to VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Quiescent Current
SYMBOL
(NOTE 1)
CONDITIONS
ICC
VCC = 5.5V,
VIN = VCC or GND
Output Current (Sink)
IOL
VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage
Current
IOH
VOL
VOH
IIN
VCC = 4.5V, VIH = 4.5V,
VOUT = VCC -0.4V,
VIL = 0V
VCC = 4.5V, VIH = 2.25V,
IOL = 50µA, VIL = 0.8V
VCC = 5.5V, VIH = 2.75V,
IOL = 50µA, VIL = 0.8V
VCC = 4.5V, VIH = 2.25V,
IOH = -50µA, VIL = 0.8V
VCC = 5.5V, VIH = 2.75V,
IOH = -50µA, VIL = 0.8V
VCC = 5.5V, VIN = VCC or
GND
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, (Note 2)
GROUP A
SUBGRO
UPS
1
2, 3
1
2, 3
1
2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1
2, 3
7, 8A, 8B
TEMPERATURE
+25^oC
+125^oC, -55^oC
+25^oC
+125^oC, -55^oC
+25^oC
+125^oC, -55^oC
+25^oC, +125^oC, -55^oC
+25^oC, +125^oC, -55^oC
+25^oC, +125^oC, -55^oC
+25^oC, +125^oC, -55^oC
+25^oC
+125^oC, -55^oC
+25^oC, +125^oC, -55^oC
NOTES:
1. All voltages reference to device GND.
2. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
LIMITS
MIN
MAX
-
40
-
750
7.2
-
6.0
-
-7.2
-
-6.0
-
-
0.1
UNITS
µA
µA
mA
mA
mA
mA
V
-
0.1
V
VCC
-
V
-0.1
VCC
-
V
-0.1
-
±0.5
µA
-
±5.0
µA
-
-
-
3
FN2462.3
September 12, 2005