X9271_11 Datasheet, PDF (15/22 Pages) Intersil Corporation – Single, Digitally Controlled (XDCP™) Potentiometer

X9271
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
Symbol
I_CC1
I_CC2
I_SB
Parameter
V_CC Supply Current
(Active)
V_CC Supply Current
(Nonvolatile Write)
V_CC Current (Standby)
I_LI
I_LO
V_IH
V_IL
V_OL
V_OH
V_OH
Input Leakage Current
Output Leakage Current
Input HIGH Voltage
Input LOW Voltage
Output LOW Voltage
Output HIGH Voltage
Output HIGH Voltage
Limits
Min.
Max.
(Note 18) Typ. (Note 18)
400
1
5
3
V_CC x 0.7
-1
V_CC - 0.8
V_CC - 0.4
10
10
V_CC + 1
V_CC x 0.3
0.4
Units
μA
mA
μA
μA
μA
V
V
V
V
V
Test Conditions
f_SCK = 2.5 MHz, SO = Open, V_CC = 6V
Other Inputs = V_SS
f_SCK = 2.5MHz, SO = Open, V_CC = 6V
Other Inputs = V_SS
SCK = SI = V_SS, Addr. = V_SS,
CS = V_CC = 6V
V_IN = V_SS to V_CC
V_OUT = V_SS to V_CC
I_OL = 3mA
I_OH = -1mA, V_CC ≥ +3V
I_OH = -0.4mA, V_CC ≤ +3V
ENDURANCE AND DATA RETENTION
Parameter
Minimum Endurance
Data Retention
Min.
(Note 18)
100,000
100
Units
Data changes per bit per register
Years
CAPACITANCE
Symbol
C_IN/OUT (Note 16)
C_OUT (Note 16)
C_IN (Note 16)
Test
Input / Output Capacitance (SI)
Output Capacitance (SO)
Input Capacitance (A0, CS, WP, HOLD, and
SCK)
Max.
(Note 18)
8
8
6
Units
pF
pF
pF
Test Conditions
V_OUT = 0V
V_OUT = 0V
V_IN = 0V
POWER-UP TIMING
Symbol
t_r V_CC (Note 16)
t_PUR (Note 17)
t_PUW (Note 17)
Parameter
V_CC Power-up Rate
Power-up to Initiation of Read Operation
Power-up to Initiation of Write Operation
Min.
(Note 18)
0.2
Max.
(Note 18)
50
1
50
Units
V/ms
ms
ms
A.C. TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
V_CC x 0.1 to V_CC x 0.9
10ns
Input and Output Timing Level
NOTES:
V_CC x 0.5
16. This parameter is not 100% tested.
17. t_PUR and t_PUW are the delays required from the time the (last) power supply (V_CC-) is stable until the specific instruction can be issued. These
parameters are periodically sampled and are not 100% tested.
18. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
15
FN8174.3
June 23, 2011