ISL71091SEH33 Datasheet, PDF (12/16 Pages) Intersil Corporation – 3.3V Radiation Hardened Ultra Low Noise,

ISL71091SEH33
Characterization vs Simulation Results
3.303
3.303
3.302
3.301
3.302
3.301
UNIT 1
UNIT 2
3.300
3.299
3.298
3.297-65 _{-45 -25}
-5 15 35 55 75
TEMPERATURE (°C)
95 115 135
FIGURE 24. SIMULATED (WORSE CASE) V_OUT vs TEMPERATURE
3.310
3.308
3.306
3.304
3.302
3.300
V_OUT
3.298
3.296
3.294
3.292
3.290
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 26. SIMULATED LINE TRANSIENT (V_IN = 500mV)
3.300
3.299
3.298
UNIT 3
UNIT 4
UNIT 5
3.297
-65 -45 -25 -5 15 35 55 75 95 115 135
TEMPERATURE (°C)
FIGURE 25. CHARACTERIZED V_OUT vs TEMPERATURE
10
8
6
4
2
V_OUT
0
-2
-4
-6
-8
-10
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 27. CHARACTERIZED LINE TRANSIENT (V_IN = 500mV)
3.38
3.36
3.34
3.32
3.30
V_OUT
3.28
3.26
3.24
3.22
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 28. SIMULATED LOAD TRANSIENT (I_L = 1mA)
80
60
40
20
V_OUT
0
-20
-40
-60
-80
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 29. CHARACTERIZED LOAD TRANSIENT (I_L = 1mA)
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FN8429.2
March 18, 2016