ISL71091SEH20 Datasheet, PDF (12/16 Pages) Intersil Corporation – 2.048V Radiation Hardened Ultra Low Noise

ISL71091SEH20
Characterization vs Simulation Results
2.051
2.051
2.050
2.050
2.049
2.048
2.047
2.046
2.049
2.048
2.047
UNIT 3
2.046
UNIT 2
UNIT 1
UNIT 4
UNIT 5
2.045
-65 -45 -25
-5 15 35 55 75
TEMPERATURE (°C)
95 115 135
FIGURE 24. SIMULATED (WORSE CASE) V_OUT vs TEMPERATURE
2.045
-65 -45 -25 -5 15 35 55 75 95 115 135
TEMPERATURE (°C)
FIGURE 25. CHARACTERIZED V_OUT vs TEMPERATURE
2.052
2.051
2.050
2.049
2.048
V_OUT
2.047
2.046
2.045
2.044
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 26. SIMULATED LINE TRANSIENT (V_IN = 500mV)
4
3
2
1
V_OUT
0
-1
-2
-3
-4
0 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 27. CHARACTERIZED LINE TRANSIENT (V_IN = 500mV)
2.128
2.109
2.089
2.069
2.048
V_OUT
2.028
2.007
1.987
1.968
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 28. SIMULATED LOAD TRANSIENT (I_L = 1mA)
80
60
40
20
V_OUT
0
-20
-40
-60
-80
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 29. CHARACTERIZED LOAD TRANSIENT (I_L = 1mA)
Submit Document Feedback ₁₂
FN8632.2
March 17, 2016