ISL55110 Datasheet, PDF (11/15 Pages) Intersil Corporation – Dual, High Speed MOSFET Driver

ISL55110, ISL55111
Typical Performance Curves Discussion
r_ON
The r_ON Source is tested by placing the device in Constant
Drive High Condition and connecting -50mA constant current
source to the Driver Output. The Voltage Drop is measured
from VH to Driver Output for r_ON calculations.
The r_ON Sink is tested by placing the device in Constant
Driver Low Condition and connecting a +50mA constant
current source. The Voltage Drop from Driver Out to Ground
is measured for r_ON Calculations.
Dynamic Tests
All dynamic tests are conducted with ISL55110, ISL55111
Evaluation Board(s) (ISL55110_11EVAL2Z). Driver Loads
are soldered to the Evaluation board. Measurements are
collected with P6245 Active FET Probes and TDS5104
Oscilloscope. Pulse Stimulus is provided by HP8131 pulse
generator.
The ISL55110, ISL55111 Evaluation Boards provide Test
Point Fields for leadless connection to either an Active FET
Probe or Differential probe. TP-IN fields are used for
monitoring pulse input stimulus. TP-OA/B monitor Driver
Output waveforms. C₆ and C₇ are the usual placement for
Driver loads. R₃ and R₄ are not populated and are provided
for User-Specified, more complex load characterization.
Pin Skew
Pin Skew measurements are based on the difference in
propagation delay of the two channels. Measurements are
made on each channel from the 50% point on the stimulus
point to the 50% point on the driver output. The difference in
the propagation delay for Channel A and Channel B is
considered to be Skew.
Both Rising Propagation Delay and Falling Propagation
Delay are measured and report as tSkewR and tSkewF.
50MHz Tests
50MHz Tests reported as No Load actually include
Evaluation board parasitics and a single TEK 6545 FET
probe. However no driver load components are installed and
C₆ through C₉ and R₃ through R₆ are not populated.
General
The Most dynamic measurements are presented in three
ways:
1. Over-temperature with a V_DD of 3.6V and V_H of 12.0V.
2. At ambient with V_H set to 12V and V_DD data points of
2.5V, 3.5V, 4.5V and 5.50V.
3. The ambient tests are repeated with V_DD of 3.3V and V_H
data points of 3V, 6V, 9V and 12V.
FIGURE 33. ISL55110/11EVAL2Z EVALUATION BOARD
11
FN6228.3
December 16, 2008