TLD1326EL_15 Datasheet, PDF (8/34 Pages) Infineon Technologies AG – 3 Channel High Side Current Source

TLD1326EL
General Product Characteristics
4
General Product Characteristics
4.1
Absolute Maximum Ratings
Absolute Maximum Ratings ¹⁾
T_j = -40 °C to +150 °C; all voltages with respect to ground, positive current flowing into pin for input pins (I), positive
currents flowing out of the I/O and output pins (O) (unless otherwise specified)
Pos.
Parameter
Symbol
Limit Values Unit Conditions
Min.
Max.
Voltages
4.1.1 Supply voltage
4.1.2 Input voltage EN
4.1.3
4.1.4
4.1.5
Input voltage EN related to V_S
Input voltage EN related to V_OUTx
V_EN - V_OUTx
Output voltage
4.1.6
4.1.7
Power stage voltage
V_PS = V_S - V_OUTx
Input voltage PWMI
4.1.8 IN_SET voltage
4.1.9 N-1 voltage
4.1.10 Feedback voltage
Currents
V_S
-16
40
V–
V_EN
-16
40
V–
V_EN(VS) V_S - 40 V_S + 16 V
–
V_EN -
-16
40
V_OUTx
V–
V_OUTx
-1
40
V–
V_PS
-16
40
V–
V_PWMI
-0.3
6
V_{IN_SET} -0.3
6
V_N-1
-0.3
6
V_FB
-0.3
40
V–
V–
V–
V–
4.1.11 IN_SET current
I_{IN_SET}
–
2
mA –
–
8
Diagnosis output
4.1.12 N-1 current
4.1.13 Feedback current
4.1.14 Output current
Temperatures
I_N-1
-0.5
0.5
mA –
I_FB
–
0.5
mA –
I_OUTx
–
130
mA –
4.1.15 Junction temperature
4.1.16 Storage temperature
ESD Susceptibility
T_j
-40
150
°C –
T_stg
-55
150
°C –
4.1.17 ESD resistivity to GND
V_ESD
-2
2
kV
4.1.18 ESD resistivity all pins to GND
V_ESD
-500
500
V
4.1.19 ESD resistivity corner pins to GND
V_ESD
-750
750
V
1) Not subject to production test, specified by design
2) ESD susceptibility, Human Body Model “HBM” according to ANSI/ESDA/JEDEC JS-001-2011
3) ESD susceptibility, Charged Device Model “CDM” according to JESD22-C101E
Human Body
Model (100 pF via
1.5 kΩ)²⁾
CDM³⁾
CDM³⁾
Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Data Sheet
8
Rev. 1.1, 2015-03-24