BTS3050TF Datasheet, PDF (19/39 Pages) Infineon Technologies AG – Smart Low-Side Power Switch

HITFET - BTS3050TF
Smart Low-Side Power Switch
Electrical Characteristics
Table 5 Electrical Characteristics: Power Stage (cont’d)
T_j = -40°C to +150°C, V_BAT = 6 V to 18 V, all voltages with respect to ground, positive current flowing into pin
(unless otherwise specified)
Parameter
Symbol
Values
Unit Note or
Min. Typ. Max.
Test Condition
Number
Dynamic characteristics - switching times single pulseV_BAT = 13.5 V, R_L = 4.7Ω;
for definition details see Figure 10 “Definition of Power Output Timing for Resistive Load” on Page 11
Turn-on time
Turn-off time
t_ON
35 75 115 µs ³⁾
P_8.1.46
V_IN = 0 V to 5 V;
V_OUT = 10% V_BAT
t_OFF
70 135 210 µs ⁴⁾
P_8.1.47
V_IN = 5 V to 0 V;
V_OUT = 90% V_BAT
Turn-on delay time
t_DON
5 15 25 µs V_IN = 0 V to 5 V;
P_8.1.48
V_OUT = 90% V_BAT
Turn-off delay time
t_DOFF
40 75 120 µs V_IN = 5 V to 0 V;
V_OUT = 10% V_BAT
P_8.1.49
Fall time, Falling output voltage (turn- t_F
on)
30 60 90 µs V_IN = 0 V to 5 V;
P_8.1.50
V_OUT = 90% V_BAT to
V_OUT = 10% V_BAT
Rise time, Rising output voltage
t_R
30 60 90 µs V_IN = 5 V to 0 V;
V_OUT = 10% V_BAT to
V_OUT = 90% V_BAT
Turn-on Slew rate
-(ΔV/Δt)_ON 0.22 0.45 0.65 V/µs ⁵⁾
V_OUT = 90% V_BAT to
V_OUT = 50% V_BAT
Turn-off Slew rate
(ΔV/Δt)_OFF
0.22 0.45 0.65
V/µs
6)
V_OUT = 50% V_BAT to
V_OUT = 90% V_BAT
1) Not subject to production test, calculated by R_thJA (JEDEC 2s2p, PCB) and R_DS(ON)
2) Not subject to production test, specified by design;
P_8.1.51
P_8.1.52
P_8.1.53
3) Not subject to production test, calculated with delay time ON and fall time
4) Not subject to production test, calculated with delay time OFF and rise time
5) Not subject to production test, calculated slew rate between 90% and 50% V_OUT;
6) Not subject to production test, calculated slew rate between 50% and 90% V_OUT;
8.2
Protection
Please see Chapter “Protection Functions” on Page 15 for parameter description and further details.
Note:
Integrated protection functions are designed to prevent IC destruction under fault conditions
described in the data sheet. Fault conditions are considered as “outside” normal operating range.
Protection functions are not designed for continuous repetitive operation
Datasheet
19
Rev. 1.0
2016-06-01