TLE9261-3QXV33 Datasheet, PDF (181/186 Pages) Infineon Technologies AG – Mid-Range System Basis Chip Family

TLE9261-3QXV33
16.2
ESD Tests
Application Information
Note: Tests for ESD robustness according to IEC61000-4-2 “gun test” (150pF, 330Ω) will been performed. The
results and test condition will be available in a test report. The target values for the test are listed in Table 38
below.
Table 38 ESD “Gun Test”
Performed Test
Result
Unit
Remarks
ESD at pin CANH, CANL, >6
kV
1)2)_{positive pulse}
VS, WK1..3, HSx, VCC2,
VCC3 versus GND
ESD at pin CANH, CANL, < -6
kV
VS, WK1..3, HSx, VCC2,
VCC3 versus GND
1)2)_{negative pulse}
1) ESD Test “Gun Test” is specified with external components for pins VS, WK1..3, HSx, VCC3 and VCC2. See the application
diagram in Chapter 16.1 for more information.
2) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3 (IEC 61000-4-2). Tested by external
test house (IBEE Zwickau, EMC Test report Nr. 07-10-13)
EMC and ESD susceptibility tests according to SAE J2962-2 (2010) have been performed. Tested by external test
house (UL LLC, Test report Nr. 2013-474A)
Data Sheet
181
Rev. 1.1, 2014-10-23