TLE4998P3C Datasheet, PDF (16/32 Pages) Infineon Technologies AG – Programmable Linear Hall Sensor

TLE4998P3C
Signal Processing
6
Signal Processing
The flow diagram in Figure 5 shows the data-processing algorithm.
Hall
Sensor
Range LP
A
D
Temperature
Sensor
TC ₂
A
D
+
X
X
1+
-T₀
TC 1
X
Temperature
C o m p e n sa ti o n
Gain
Limiter
(Clam p)
X+
X
Protocol
Generation
out
Offset
Stored in
EEPROM
Memory
Figure 5 Signal Processing Flow
Magnetic Field Path
• The analog output signal of the chopped Hall-effect cell is converted to a digital signal
in the continuous-time A/D converter. The range of the chopped A/D converter can be
set in several steps (see Table 6). This gives a suitable level for the A/D converter
• After the A/D conversion, a digital-low pass filter reduces the band width (Table 10).
• A multiplier amplifies the value depending on the gain (see Table 8) and temperature
compensation settings
• The offset value is added (see Table 9)
• A limiter reduces the resulting signal to 12 bits and feeds the Protocol Generation
stage
Temperature Compensation
(Details are given in Chapter 8)
• The output signal of the temperature cell is also A/D converted
• The temperature is normalized by subtraction of the reference temperature T₀ value
(zero point of the quadratic function)
Data Sheet
16
Rev 1.1, 2009-09