IDT5T9304 Datasheet, PDF (8/15 Pages) Integrated Device Technology – LVDS, 1:4 Clock Buffer Terabuffer™

IDT5T9304 Data Sheet
2.5V LVDS, 1:4 CLOCK BUFFER TERABUFFER™
Table 5F. AC Characteristics^(1,5), V_DD = 2.5V±0.2V, T_A = 0°C to 70°C
Symbol Parameter
Test Conditions
tsk(o)
Same Device Output Pin-to-Pin Skew ⁽²⁾
tsk(p)
Pulse Skew⁽³⁾
tsk(pp) Part-to-Part Skew⁽⁴⁾
Minimum
Typical
Maximum
50
125
300
Units
ps
ps
ps
tp_LH
tp_HL
fo
t_PGE
t_PGD
Propagation Delay, Low-to-High
Propagation Delay, High-to-Low
Frequency Range⁽⁶⁾
Output Gate Enable Crossing
VTHI-to-Qn/Qn Crosspoint
Output Gate Enable Crossing
VTHI-to-Qn/Qn Crosspoint Driven to
Designated Level
A Crosspoint to Qn, Qn
Crosspoint
1.25
1.75
ns
1.25
1.75
ns
450
MHz
3.5
ns
3.5
ns
t_PWRDN PD Crossing V_THI-to-Qn = V_DD, Qn = V_DD
t_PWRUP
Output Gate Disable Crossing V_THI to
Qn/Qn Driven to Designated Level
t_R / t_F
Output Rise/Fall Time⁽⁶⁾
20% to 80%
125
100
µS
100
µS
600
ps
NOTE. Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1. AC propagation measurements should not be taken within the first 100 cycles of startup.
NOTE 2. Skew measured between Crosspoint of all differential output pairs under identical input and output interfaces, transitions and load
conditions on any one device.
NOTE 3. Skew measured is the difference between propagation delay times tp_HL and tp_LH of any differential output pair under identical input
and output interfaces, transitions and load conditions on any one device.
NOTE 4. Skew measured is the magnitude of the difference in propagation times between any single differential output pair of two devices,
given identical transitions and load conditions at identical VDD levels and temperature.
NOTE 5. All parameters are tested with a 50% input duty cycle.
NOTE 6. Guaranteed by design but not production tested.
IDT5T9304 REVISION A JANUARY 21, 2010
8
©2010 Integrated Device Technology, Inc.