IDT70V7288S_07 Datasheet, PDF (7/16 Pages) Integrated Device Technology – HIGH-SPEED 3.3V 32K x 16 BANK-SWITCHABLE DUAL-PORTED SRAM WITH EXTERNAL BANK SELECTS

IDT70V7288S/L
64K x 16 3.3V Bank-Switchable Dual-Ported SRAM with External Bank Selects Industrial and Commercial Temperature Ranges
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
3ns Max.
1.5V
1.5V
Figures 1,2 and 3
DATAOUT
INT
435Ω
3.3V
590Ω
30pF
DATAOUT
435Ω
3.3V
590Ω
5pF*
4077 tbl 11
4077 drw 03
,
4077 drw 04
Figure 1. AC Output Test Load
Figure 2. Output Test Load
8
(for tLZ, tHZ, tWZ, tOW)
7
6
R ₅
O ∆ tACE/tAA ₄
(Typical, ns)
F ₃
2
D ₁
- 10pF is the I/O capacitance
of this device, and 30pF is the
AC Test Load Capacitance
E ₀
20 40 60 80 100 120 140 160 180 200
D _-1
Capacitance (pF)
N ^{S ,}
4077 drw 05
E ^N Figure 3. Lumped Capacitance Load Typical Derating Curve
*Including scope and jig.
M _{IG AC Electrical Characteristics Over the}
M ^S Operating Temperature and Supply Voltage Range⁽⁴⁾
O E 70V7288X15
Com'l Only
C ^D Symbol
Parameter
Min. Max.
READ CYCLE
RE ^{W tRC}
Read Cycle Time
15
____
E _tAA
Address Access Time
T _{N tACE}
Chip Enable Access Time⁽³⁾
____
15
____
15
tABE
Byte Enable Access Time⁽³⁾
____
15
NO ^tAOE
Output Enable Access Time
____
9
70V7288X20
Com'l Only
Min. Max.
20
____
____
20
____
20
____
20
____
10
70V7288X25
Com'l & Ind
Min. Max. Unit
25
____
ns
____
25 ns
____
25 ns
____
25 ns
____
11 ns
tOH
Output Hold from Address Change
3
____
3
____
3
____
ns
tLZ
Output Low-Z Time^(1,2)
0
____
0
____
0
____
ns
tHZ
Output High-Z Time^(1,2)
____
8
____
9
____
10 ns
tPU
Chip Enab le to Power Up Time^(2,5)
0
____
0
____
0
____
ns
tPD
Chip Disable to Power Down Time ^(2,5)
____
15
____
20
____
25 ns
tM OP
Mailbox Flag Update Pulse (OE or MBSEL)
10
____
10
____
10
____
ns
tM AA
Mailbox Address Access Time
____
15
____
20
____
25 ns
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM, CE = VIL and MBSEL = VIH. To access mailbox, CE= VIH and MBSEL = VIL.
4. 'X' in part numbers indicates power rating (S or L).
5. Refer to Truth Table I.
4077 tbl 12
6.742