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831742I Datasheet, PDF (7/20 Pages) Integrated Device Technology – 4:2 Differential Clock/Data Multiplexer
Parameter Measurement Information
3.3V±0.3V
VDD
33Ω
HCSL
33Ω
IREF
GND
475Ω
50Ω
49.9Ω
50Ω
49.9Ω
Qx
2pF
nQx
2pF
0V
This load condition is used for VRB, VMAX, VMIN, VCROSS, and
VCROSS measurements.
3.3V HCSL Output Load AC Test Circuit
831742I Data Sheet
3.3V±0.3V
VDD
HCSL
IREF
GND
SCOPE
0V 0V
This load condition is used for tsk(o), tsk(pp), tsk(i), tPD and
tjit measurements.
3.3V HCSL Output Load AC Test Circuit
VDD
nCLK[0:3]
V
PP
CLK[0:3]
GND
Cross Points
V
CMR
Part 1
nQx
Qx
nQy Par t 2
Qy
t sk(pp)
Differential Input Level
Part-to-Part Skew
nQx
Qx
nQy
Qy
Output Skew
nCLK[0:3]
CLK[0:3]
nQA, nQB
QA, QB
tPD
Propagation Delay
©2016 Integrated Device Technology, Inc
7
April 5, 2016