ICS84329-01 Datasheet, PDF (6/20 Pages) Integrated Device Technology – 700MHZ, LOW JITTER, CRYSTAL-TO-3.3V DIFFERENTIAL LVPECL FREQUENCY SYNTHESIZER

TABLE 5. CRYSTAL CHARACTERISTICS
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
ICS84329-01
700MHZ, LOW JITTER, CRYSTAL-TO-3.3V
DIFFERENTIAL LVPECL FREQUENCY SYNTHESIZER
Test Conditions
Minimum Typical Maximum
Fundamental
10
25
70
7
Units
MHz
Ω
pF
TABLE 6. INPUT FREQUENCY CHARACTERISTICS, V_CC = V_CCA = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
XTAL; NOTE 1
10
17
MHz
f_IN
Input Frequency XTAL; NOTE 1, 2
S_CLOCK
17
25
MHz
50
MHz
NOTE 1: For the crystal frequency range the M value must be set to achieve the minimum or maximum VCO frequency
range of 200MHz or 700MHz. Using the minimum frequency of 10MHz valid values of M are 320 ≤ M ≤ 511.
Using the maximum frequency of 25MHz valid values of M are 128 ≤ M ≤ 448.
NOTE 2: For crystal frequencies greater than 17MHz, a series tuning capacitor is required for proper operation.
For more information, please refer to the Application Information, "Crystal Input and Oscillator Interface".
TABLE
7.
AC
CHARACTERISTICS,
V
CC
=
V
CCA
=
3.3V±5%,
TA
=
0°C
TO
70°C
Symbol Parameter
Test Conditions
F_OUT
tjit(per)
Output Frequency
Period Jitter, RMS; NOTE 1, 2
fOUT ≥ 65MHz
fOUT < 65MHz
tjit(cc) Cycle-to-Cycle Jitter; NOTE 1, 2
fOUT ≥ 50MHz
fOUT < 50MHz
t_R / t_F
t_S
t_H
t_L
odc
Output Rise/Fall Time
Setup Time
Hold Time
PLL Lock Time
Output Duty Cycle
20% to 80%
See Parameter Measurement Information section.
Characterized using a 16MHz XTAL.
NOTE 1: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 2: See Applications section.
Minimum
300
5
5
45
Typical
50
Maximum
700
5.5
12
35
50
800
10
55
Units
MHz
ps
ps
ps
ps
ps
ns
ns
ms
%
84329AM-01
www.idt.com
6
REV. D AUGUST 7, 2010