9ZXL1530 Datasheet, PDF (5/19 Pages) Integrated Device Technology – Fixed feedback path

9ZXL1530
15-OUTPUT LOW POWER DIFFERENTIAL ZBUFFER FOR PCIE GEN3 AND QPI
Absolute Maximum Ratings
Stresses above the ratings listed below can cause permanent damage to the 9ZXL1530. These ratings, which are standard
values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any other
conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over
the recommended operating temperature range.
PARAMETER
SYM BO L
CONDITIONS
3.3V Core Supply Voltage VDDA, R
3.3V Logic Supply Voltage
VDD
I/O Supply Voltage
VDDIO
Input Low Voltage
V_IL
Input High Voltage
VIH
Except for SMBus interface
Input High Voltage
VIHSM B
SMBus clock and data pins
Storage Temperature
Ts
Junction Temperature
Input ESD protection
Tj
ESD prot
Human Body Model
1_{Guaranteed by design and characterization, not 100% tested in production.}
2 _{Operation under these conditions is neither implied nor guaranteed.}
M IN
TYP
MAX ^{UNITS NOTES}
4.6
V
1,2
4.6
V
1,2
4.6
V
1,2
GND-0. 5
V
1
VDD+0.5V V
1
5. 5V
V
1
-65
1 50
°_C
1
1 25
°C
1
20 00
V
1
Electrical Characteristics–Clock Input Parameters
TA = TCOM; Supply Voltage VDD/VD DA = 3.3 V +/-5%, VDDIO = 1.05 to 3.3V +/-5%. See Test Loads for Loading Conditions
PARAMETER
SYM BOL
CONDITIONS
M IN
TYP
MAX
Input High Voltage - DIF_IN VIHDIF
Input Low Voltage - DIF_IN
Input C ommon Mode Voltage
- DIF_IN
Input Amplitude - D IF_IN
Input Slew Rate - DIF_IN
Input Leakage Current
Input Duty Cycle
VIL DIF
V CO M
V S W ING
dv/dt
I_IN
dtin
Differential inputs
(single-ended measurement)
Differential inputs
(single-ended measurement)
Common Mode Input Voltage
Peak to Peak value
Measured differentially
V_IN = V_{DD ,} V_IN = GND
Measurement from differential wavefrom
60 0
80 0
VSS - 300
0
30 0
30 0
0.4
-5
45
1 150
3 00
1 000
1 450
8
5
55
Input Jitter - Cycle to Cycle
J DIF In
Differential Measurement
0
1 25
1 _{Guaranteed by design and characterization, not 100% tested in production.}
2_{Slew rate measured through +/-75mV window centered around differential zero}
UNITS NOTES
mV
1
mV
1
mV
1
mV
1
V/ns 1,2
uA
1
%
1
ps
1
IDT® 15-OUTPUT LOW POWER DIFFERENTIAL ZBUFFER FOR PCIE GEN3 AND QPI
5
9ZXL1530
REV C 031312