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| 8101925 Datasheet, PDF (4/11 Pages) Integrated Device Technology – VCXO-to-LVCMOS/ LVTTL Output | |||
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8101925 Datasheet
Table 3C. LVCMOS/LVTTL DC Characteristics, VDD = 3.3V ± 5%, VDDO = 3.3V ± 5% or 2.5V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
VIH
Input
High Voltage
VDD = 3.465V
2
VDD = 2.625V
1.7
VIL
Input
Low Voltage
VDD = 3.465V
-0.3
VDD = 2.625V
-0.3
VLF1
VCXO Control Voltage
0
IIH
Input High Current
VDD = VIN = 3.465V or 2.625V
IIL
Input Low Current
VDD = 3.465V or 2.625V, VIN = 0V
-5
VOH
Output High Voltage
VDDO = 3.3V ± 5%, IOH = -12mA
2.6
VDDO = 2.5V ± 5%, IOH = -12mA
1.8
VOL
Output Low Voltage
VDDO = 3.3V or 2.5V ± 5%,
IOL = 12mA
VDD + 0.3
V
VDD + 0.3
V
0.8
V
0.7
V
VDD
V
150
µA
µA
V
V
0.5
V
AC Electrical Characteristics
Table 4A. AC Characteristics, VDD = VDDO = 3.3V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
fOUT
Output Frequency
fIN
Input Frequency
tjit(ï±)
RMS Phase Jitter (Random);
NOTE 1
fOUT = 25MHz, Integration Range:
12kHz â 5MHz
tR / tF
odc
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
650
40
Typical
25
0.4
Maximum
5
19.44
1050
60
Units
MHz
MHz
MHz
ps
ps
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
NOTE: Characterized using a 48Hz bandwidth filter.
NOTE 1: Refer to the Phase Noise Plot.
Table 4B. AC Characteristics, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
fOUT
Output Frequency
fIN
Input Frequency
tjit(ï±)
RMS Phase Jitter (Random);
fOUT = 25MHz, Integration Range:
12kHz â 5MHz
tR / tF
odc
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
900
40
Typical
25
0.4
Maximum
5
19.44
1600
60
Units
MHz
MHz
MHz
ps
ps
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. Device will meet specifications after thermal equilibrium has
been reached under these conditions.
NOTE: Characterized using a 48Hz bandwidth filter.
©2016 Integrated Device Technology, Inc.
4
Revision B, November 7, 2016
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