IDT71124_13 Datasheet, PDF (3/8 Pages) Integrated Device Technology – CMOS Static RAM 1 Meg (128K x 8-Bit) Revolutionary Pinout Equal access and cycle times

IDT 71124 CMOS Static RAM
1 Meg (128K x 8-bit) Revolutionary Pinout
Commercial and Industrial Temperature Ranges
DC Electrical Characteristics
(VCC = 5.0V ± 10%, Commercial and Industrial Temperature Ranges)
Symbol
Parameter
Test Conditions
|ILI|
Input Leakage Current
VCC = Max., VIN = GND to VCC
|ILO| Output Leakage Current
VCC = Max., CS = VIH, VOUT = GND to VCC
VOL
Output Low Voltage
IOL = 8mA, VCC = Min.
Min.
Max. Unit
__ _
5
µA
__ _
5
µA
__ _
0.4
V
VOH
Output High Voltage
IOH = –4mA, VCC = Min.
2.4
__ _
V
3514 tbl 06
DC Electrical Characteristics⁽¹⁾
(VCC = 5.0V ± 10%, VLC = 0.2V, VHC = VCC – 0.2V)
71124S12
71124S15
Symbol
Parameter
Com'l.
Com'l.
Ind.
ICC ^{Dynamic Operating Current}
160
155
155
CS < VIL, Outputs Open, VCC = Max., f = fMAX⁽²⁾
ISB ^{Standby Power Supply Current (TTL Level)}
40
40
40
CS > VIH, Outputs Open, VCC = Max., f = fMAX⁽²⁾
Full Standby Power Supply Current (CMOS Level)
10
10
10
ISB1 _{CS > VHC, Outputs Open, VCC = Max., f = 0(2)}
VIN < VLC or VIN > VHC
NOTES:
1. All values are maximum guaranteed values.
2. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.
71124S20
Com'l.
Ind.
Unit
140
140
mA
40
40
mA
10
10
mA
3514 tbl 07
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
AC Test Loads
5V
GND to 3.0V
3ns
1.5V
1.5V
See Figure 1 and 2
3514 tbl 08
DATA OUT
30pF
480Ω
255Ω
.
3514 drw 03
Figure 1. AC Test Load
6.432
5V
DATA OUT
480Ω
5pF*
255Ω
.
3514 drw 04
*Including jig and scope capacitance.
Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)