ADC1207S080 Datasheet, PDF (13/20 Pages) NXP Semiconductors – Single 12 bits ADC, up to 80 MHz with direct/ultra high IF sampling

Integrated Device Technology
ADC1207S080
Single 12 bits ADC, up to 80 MHz with direct/ultra high IF sampling
11. Definitions
11.1 Static parameters
11.1.1 Integral Non-Linearity (INL)
It is defined as the deviation of the transfer function from a best fit straight line (linear
regression computation). The INL of the code i is obtained from the equation:
INLi = -^V---ⁱ--^--ⁱ---^---^–-----^V-_S--ⁱ--^--ⁱ--^d----^e---^a---^l--^-
where: S corresponds to the slope of the ideal straight line (code width); i corresponds to
the code value; V_i is the input voltage.
11.1.2 Differential Non-Linearity (DNL)
It is the deviation in code width from the value of 1 LSB.
DNLi = -^V---ⁱ--^--ⁱ----⁺----¹---_S-^---^–-----^V----ⁱ-^---ⁱ--^
where: V_i is the input voltage; i from 0 to (2ⁿ  2).
11.2 Dynamic parameters
Figure 7 shows the spectrum of a single tone full-scale input sine wave with frequency f,
conforming to coherent sampling (f/f_s = M/N, with M number of cycles and N number of
samples, M and N being relatively prime), and digitized by the ADC under test.
a₁
magnitude
SFDR
s
a₂
a₃
a_k
ADC1207S080_3
Product data sheet
frequency
014aaa437
Fig 7. Single tone spectrum of full-scale input sine wave with frequency f_t
Rev. 03 — 2 July 2012
© IDT 2012. All rights reserved.
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