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ICS87972I Datasheet, PDF (7/14 Pages) Integrated Circuit Systems – LOW SKEW, 1-TO-12 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER
Integrated
Circuit
Systems, Inc.
ICS87972I
LOW SKEW, 1-TO-12
LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V
DDX
Inputs, VDD
Outputs, V
DDO
Package Thermal Impedance, θJA
Storage Temperature, TSTG
4.6V
-0.5V to VDD + 0.5 V
-0.5V to V + 0.5V
DDO
42.3°C/W (0 lfpm)
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the DC Characteristics or AC Character-
istics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
TABLE
4A.
POWER
SUPPLY
DC CHARACTERISTICS,
V
DD
=
V
DDA
=
V
DDO
=
3.3V±5%,
TA
=
-40°C
TO
85°C
Symbol Parameter
Test Conditions Minimum Typical
VDD
Core Supply Voltage
VDDA
Analog Supply Voltage
VDDO
Output Supply Voltage
IDD
Power Supply Current
All power pins
IDDA
Analog Supply Current
NOTE: Special thermal handling may be required in some configurations.
3.135
3.3
3.135
3.3
3.135
3.3
Maximum
3.465
3.465
3.465
215
20
Units
V
V
V
mA
mA
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum
VIH
Input High Voltage
VIL
Input Low Voltage
IIN
Input Current
VOH
Output High Voltage
VOL
Output Low Voltage
IOH = -20mA
IOL = 20mA
2
3.6
0.8
±120
2.4
0.5
Units
V
V
µA
V
V
TABLE 5. INPUT FREQUENCY CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
CLK0, CLK1; NOTE 1
120
MHz
fIN
Input Frequency XTAL1, XTAL2
FRZ_CLK
10
25
MHz
20
MHz
NOTE 1: Input frequency depends on Feedback divide ratio to ensure the clock * Feedback Divide is in the VCO range of
200MHz - 480MHz.
87972DYI
www.icst.com/products/hiperclocks.html
7
REV. A OCTOBER 18, 2002