ICS840002-32 Datasheet, PDF (3/8 Pages) Integrated Circuit Systems – FEMTOCLOCKS™ CRYSTAL-TO LVCMOS/LVTTL FREQUENCY SYNTHESIZER

Integrated
Circuit
Systems, Inc.
PRELIMINARY
ICS840002-32
FEMTOCLOCKS™ CRYSTAL-TO-
LVCMOS/LVTTL FREQUENCY SYNTHESIZER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V_DD
Inputs, V_I
Outputs, V_O
Package Thermal Impedance, θ_JA
Storage Temperature, T_STG
4.6V
-0.5V to V_DD + 0.5 V
-0.5V to V_DDO + 0.5V
101.7°C/W (0 mps)
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device.These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the DC Characteristics or AC Character-
istics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
TABLE 3A. POWER SUPPLY DC CHARACTERISTICS, V_DD = V_DDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum
V_DD
V_DDO
I_DD
I
DDO
Core Supply Voltage
Output Supply Voltage
Power Supply Current
Output Supply Current
3.135
3.135
Typical
3.3
3.3
TBD
TBD
Maximum
3.465
3.465
Units
V
V
mA
mA
TABLE 3B. POWER SUPPLY DC CHARACTERISTICS, V_DD = 3.3V±5%, V_DDO = 2.5V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical
V_DD
V_DDO
I_DD
I_DDO
Core Supply Voltage
Output Supply Voltage
Power Supply Current
Output Supply Current
3.135
2.375
3.3
2.5
TBD
TBD
Maximum
3.465
2.625
Units
V
V
mA
mA
TABLE 3C. LVCMOS/LVTTL DC CHARACTERISTICS, V_DD = 3.3V±5%, V_DDO = 3.3V±5% OR 2.5V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
V_IH
Input High Voltage SEL
2
V_DD + 0.3
V
V_IL
Input Low Voltage SEL
-0.3
0.8
V
I_IH
Input High Current SEL
I_IL
Input Low Current SEL
V_DD = V_IN = 3.465V
V_DD = 3.465V, V_IN = 0V
-150
5
µA
µA
V_OH
Output High Voltage; NOTE 1
V_DDO = 3.3V ± 5%
V = 2.5V ± 5%
2.6
1.8
V
V
DDO
V_OL
Output Low Voltage; NOTE 1
V_DDO = 3.3V or 2.5V ± 5%
0.5
V
NOTE
1:
Outputs
terminated
with
50Ω
to
V /2.
DDO
See
Parameter
Measurement
Information,
Output
Load
Test
Circuit.
TABLE 4. CRYSTAL CHARACTERISTICS
Parameter
Mode of Oscillation
Test Conditions
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Drive Level
NOTE: Characterized using an 18pF parallel resonant crystal.
840002BG-32
www.icst.com/products/hiperclocks.html
3
Minimum Typical Maximum
Fundamental
26.5625
50
7
1
Units
MHz
Ω
pF
mW
REV. A JUNE 27, 2005