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IC41C4400x Datasheet, PDF (8/20 Pages) Integrated Circuit Solution Inc – 4Mx4 bit Dynamic RAM with EDO Page Mode
IC41C4400x and IC41LV4400x Series
AC CHARACTERISTICS (Continued)(1,2,3,4,5,6)
(Recommended Operating Conditions unless otherwise noted.)
Symbol
tACH
tOEH
tDS
tDH
tRWC
tRWD
tCWD
tAWD
tPC
tRASP
tCPA
tPRWC
tCOH
tOFF
tWHZ
tCSR
tCHR
tORD
tREF
tT
Parameter
Column-Address Setup Time to CAS
Precharge during WRITE Cycle
OE Hold Time from WE during
READ-MODIFY-WRITE cycle(18)
Data-In Setup Time(15, 22)
Data-In Hold Time(15, 22)
READ-MODIFY-WRITE Cycle Time
RAS to WE Delay Time during
READ-MODIFY-WRITE Cycle(14)
CAS to WE Delay Time(14, 20)
Column-Address to WE Delay Time(14)
EDO Page Mode READ or WRITE
Cycle Time
RAS Pulse Width in EDO Page Mode
Access Time from CAS Precharge(15)
EDO Page Mode READ-WRITE
Cycle Time
Data Output Hold after CAS LOW
Output Buffer Turn-Off Delay from
CAS or RAS(13,15,19, 24)
Output Disable Delay from WE
CAS Setup Time (CBR REFRESH)(20, 25)
CAS Hold Time (CBR REFRESH)( 21, 25)
OE Setup Time prior to RAS during
HIDDEN REFRESH Cycle
Auto Refresh Period
2,048 Cycles
4,096 Cycles
Transition Time (Rise or Fall)(2, 3)
-50
Min. Max.
15
−
8
−
0
−
8
−
108 −
64
−
26
−
39
−
20
−
50 100K
−
30
56
−
5
−
0
12
3
10
5
−
8
−
0
−
−
32
−
64
1
50
AC TEST CONDITIONS
Output load:
Two TTL Loads and 50 pF
Input timing reference levels: VIH = 2.4V, VIL = 0.8V
Output timing reference levels: VOH = 2.0V, VOL = 0.8V
-60
Min. Max.
15
−
10
−
0
−
10
−
133 −
77
−
32
−
47
−
25
−
60 100K
−
35
68
−
5
−
0
15
3
10
5
−
10
−
0
−
−
32
−
64
1
50
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ns
8
Integrated Circuit Solution Inc.
DR007-0B 10/17/2002