IC-MFP Datasheet, PDF (2/13 Pages) IC-Haus GmbH – 8-FOLD FAIL-SAFE P-FET DRIVER

iC-MFP
8-FOLD FAIL-SAFE P-FET DRIVER
Rev A2, Page 2/13
DESCRIPTION
iC-MFP is a monolithically integrated, 8-channel
inverting level adjustment device which drives P-
channel FETs. The internal circuit blocks have been
designed in such a way that with single errors, such
as open pins (VB, VBR, GND, GNDR) or the short-
circuiting of two outputs, iC-MFP’s output stages
switch to a predefined, safe high state. Externally
connected P-channel FET are thus shut down safely
in the event of a single error.
Should the supply voltage at VB undershoot a prede-
fined threshold, the voltage monitor causes the out-
puts to be actively tied to VB via the highside transis-
tors. If the supply voltage ceases to be applied to VB,
the outputs are tied to VBR by pull-up resistors.
If the connection between the ground potential and
the GND or GNDR pin is disrupted, the highside tran-
sistors are activated.
The inputs of the eight channels consist of a Schmitt
trigger with a pull-down current source and are com-
patible with TTL and CMOS levels and are voltage-
proof up to 40 V. The eight channels have a current-
limited push-pull output stage and a pull-up resistor
at the output. The hi-level at one of the inputs EN5,
EN10 or ENFS defines the output lo-level VB - 5 V,
VB - 10 V or GND voltage and enables the outputs.
The output lo-level is disabled with the lo-level at all
inputs EN5, EN10 and ENFS or with the hi-level at
more than one input.
iC-MFP monitors the supply voltage at VB and VBR
pin and the voltages at the two ground pins GND and
GNDR. Both power supply pins VB and VBR and
both pins GND and GNDR must be connected to-
gether externally in order to guarantee the safe high
state of the output stages in the event of error.
Pull-down currents provide the safe lo-level at open
inputs IN1. . . 8, EN5, EN10 and ENFS. The pull-
down currents have two stages in order to minimize
power dissipation with enhanced noise immunity.
When two outputs of different logic states are short
circuited, the driving capability of the highside driver
predominates, keeping the connected P-channel
FETs in a safe shutdown state.
The status of the device is indicated with the Open-
Drain pin NOK and can be used for system diagnos-
tics.
Temperature monitoring protects the device from too
high power dissipation.
The device is protected against destruction by ESD.