HY29F800A Datasheet, PDF (23/40 Pages) Hynix Semiconductor – 8 Megabit (1Mx8/512Kx16), 5 Volt-only, Flash Memory

KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
HY29F800A
OUTPUTS
Changing from H to L
Changing from L to H
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Centerline is High Impedance State
(High Z)
TEST CONDITIONS
+ 5V
DEVICE
UNDER
TEST
C_L
6.2
KOhm
2.7
KOhm
All diodes
are
1N3064
or
equivalen
Figure 11. Test Setup
Table 7. Test Specifications
Test
Condition
- 50
- 55
- 70
- 90
Unit
Output Load
1 TTL Gate
Output Load Capacitance (C_L) 30 100 pF
Input Rise and Fall Times
5 20 ns
Input Signal Low Level
0.0 0.45 V
Input Signal High Level
3.0 2.4 V
Low Timing Measurement
Signal Level
1.5 0.8 V
High Timing Measurement
Signal Level
1.5 2.0 V
3.0 V
Input 1.5 V
Measurement Level
1.5 V
0.0 V
HY29F800A-50, -55 Version
2.4 V
0.45 V
Input
2.0 V
0.8 V
Measurement
Levels
2.0 V
0.8 V
HY29F800A-70, -90 Versions
Figure 12. Input Waveforms and Measurement Levels
Rev. 1.1/Feb 02
Output
Output
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