HCPL-553X Datasheet, PDF (9/14 Pages) Agilent(Hewlett-Packard) – Hermetically Sealed, Transistor Output Optocouplers for Analog and Digital Applications

Typical Characteristics
All typical values are at T_A = 25°C, V_CC = 5 V, unless otherwise specified.
Parameter
Symbol
Test Conditions
Typ.
Units
Fig. Notes
Input Capacitance
C_IN
V_F = 0 V, f = 1 MHz
60
pF
1
Input Diode Temperature Coefficient ∆V_F/∆T_A
I_F = 20 mA
-1.5 mV/°C
1
Resistance (Input-Output)
R_I-O
V_I-O = 500 V
10¹²
Ω
3
Capacitance (Input-Output)
C_I-O
f = 1 MHz
1.0
pF
Transistor DC Current Gain
h_FE
V_O = 5 V, I_O = 3 mA
250
-
Small Signal Current Transfer Ratio ∆I_O/∆I_F
V_CC = 5 V, V_O = 2 V
21
%
1, 11
1
7
1
Common Mode Transient Immunity
|CM_H| I_F = 0 mA, R_L = 8.2 kΩ,
1000
V/µs
10
1, 7
at Logic High Level Output
V_O (min) = 2.0 V,
V_CM = 10 V_P-P
Common Mode Transient Immunity
|CM_L| I_F = 16 mA, R_L = 8.2 kΩ, -1000 V/µs
10
1, 7
at Logic Low Level Output
V_O (max) = 0.8 V,
V_CM = 10 V_P-P
Bandwidth
BW
9
MHz
8
8
Multi-Channel Product Only
Parameter
Symbol
Input-Input Insulation Leakage Current I_I-I
Resistance (Input-Input)
R_I-I
Capacitance (Input-Input)
C_I-I
Test Conditions
RH ≤ 65%, V_I-I = 500 V, t = 5 s
V_I-I = 500 V
f=1 MHz
Typ. Units Notes
1
pA
5, 9
10¹²
Ω
5
0.8
pF
5
Notes:
1. Each channel of a multi-channel device.
2. Current Transfer Ratio is defined as the ratio
of output collector current, I_O, to the
forward LED input current, I_F, times 100%.
CTR is known to degrade slightly over the
unit’s lifetime as a function of input current,
temperature, signal duty cycle, and system
on time. Refer to Application Note 1002 for
more detail. ln short, it is recommended that
designers allow at least 20-25% guardband
for CTR degradation.
3. All devices are considered two-terminal
devices; measured between all input leads
or terminals shorted together and all output
leads or terminals shorted together.
4. The 4N55, 4N55/883B, HCPL-257K, HCPL-
6530, HCPL-6531, and HCPL-653K dual
channel parts function as two independent
single channel units. Use the single channel
parameter limits. I_F = 0 mA for channel
under test and I_F = 20 mA for other
channels.
5. Measured between adjacent input pairs
shorted together for each multichannel
device.
6. t_PHL propagation delay is measured from the
50% point on the leading edge of the input
pulse to the 1.5 V point on the leading edge
of the output pulse. The t_PLH propagation
delay is measured from the 50% point on the
trailing edge of the input pulse to the 1.5 V
point on the trailing edge of the output
pulse.
7. CM_L is the maximum rate of rise of the
common mode voltage that can be
sustained with the output voltage in the
logic low state (V_O < 0.8 V). CM_H is the
maximum rate of fall of the common mode
voltage that can be sustained with the
output voltage in the logic high state (V_O >
2.0 V).
8. Bandwidth is the frequency at which the ac
output voltage is 3 dB below the low
frequency asymptote. For the HCPL-5530
the typical bandwidth is 2 MHz.
9. This is a momentary withstand test, not an
operating condition.
10. Higher CTR minimums are available to
support special applications.
11. Measured between each input pair shorted
together and all output connections for that
channel shorted together.
12. Standard parts receive 100% testing at 25°C
(Subgroups 1 and 9). SMD and 883B parts
receive 100% testing at 25, 125, and -55°C
(Subgroups 1 and 9, 2 and 10, 3 and 11,
respectively).
13. Not required for 4N55, 4N55/883B, HCPL-
257K, 5962-8767901, and 5962-8767905
types.
14. Required for 4N55, 4N55/883B, HCPL-257K,
5962-8767901, and 5962-8767905 types only.
9