N2100B Datasheet, PDF (2/4 Pages) Agilent(Hewlett-Packard) – Digital Communication Analyzer

Applications
New Features
Measurements
The N2100B is primarily targeted at production automated test applications.
The wideband optical input is ideally suited to electro-optical transceivers, short
reach parallel optics modules and transmitter optical sub-assemblies (TOSAs).
The electrical input is suited to high-speed serial data interconnects and
receiver optical sub-assemblies (ROSAs).
Typical applications include:
• Transceiver Test
• Telecomms Equipment Test
• Fibre Channel, Ethernet, PON, Parallel Optics, etc*
• Multi-port system testing
• High port count burn-in test
(* Compliance filters for other rates available on request)
Smart Post Processing enables multiple acquisitions to be made but without any pro-
cessing of the data occurring at the same time. The user can determine the optimal
time to perform the processing of the acquired data. Processing the data is slower
than acquiring the data so this will allow optical transceiver manufacturers increase
throughput by deferring the processing to a time where the DCA would normally not
be in-use.
The ER Correction Factor enables the user to apply an offset to the measured Extinc-
tion Ratio. This feature enables even tighter correlation with other instruments.
Digital Communication Analysis
• Mask Margin (with a user friendly mask configuration tool)
• Alternate Mask Margin rules available
• The mask margin (positive or negative) can be extracted for a defined number of
points that fail, thus allowing for DUT quality assessment, control and binning.
• The number of failed points for a region can be returned as well as the
actual points that failed along with the 3 bit history of that failed point
(as a result of vector sampling).
• Extinction Ratio / OMA measurements
• Eye opening, height, and width
• P-P and RMS noise measurements
• Duty-cycle distortion
• Rise and fall time
• Histogram measurements (GUI only)
• Deterministic jitter
• Random jitter
Automatic Mask Test Measurement including a call to determine the
margin that x number of points fail the “Mask Margin Test”
Multiple measurements can be made at the same time.
Note: The color coding in the eye diagram highlights the transition history of the measured point -
this is derived by using the vector sampling technique.
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