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S10140-1007_15 Datasheet, PDF (3/13 Pages) Hamamatsu Corporation – CCD area image sensor
CCD area image sensor
S10140/S10141 series
Electrical characteristics (Ta=25 °C)
Parameter
Symbol
Min.
Signal output frequency
fc
-
S1014*-1007
-
Vertical shift register
capacitance
S1014*-1008/-1107
S1014*-1108/-1009
CP1V, CP2V
-
-
S1014*-1109
-
Horizontal shift register
capacitance
S1014*-1007/-1008/-1009
S1014*-1107/-1108/-1109
CP1H, CP2H
-
-
Summing gate capacitance
CSG
-
Reset gate capacitance
CRG
-
Transfer gate capacitance
Charge transfer efficiency*5
DC output level*6
Output impedance*6
Power consumption*6 *7
S1014*-1007/-1008/-1009
S1014*-1107/-1108/-1109
CTG
CTE
Vout
Zo
P
-
-
0.99995
16
-
-
*5: Charge transfer efficiency per pixel, measured at half of the full well capacity
*6: The values depend on the load resistance. (Typ. VOD=24 V, Load resistance=100 kΩ)
*7: Power consumption of the on-chip amplifier plus load resistance
Typ.
250
800
1600
3200
6400
80
150
30
30
50
70
0.99999
17
8
4
Max.
Unit
500
kHz
-
-
-
pF
-
-
-
pF
-
pF
-
pF
-
-
pF
-
-
18
V
-
kΩ
-
mW
Electrical and optical characteristics (Ta=25 °C, unless otherwise noted)
Parameter
Symbol
Min.
Typ.
Max.
Unit
Saturation output voltage
Vsat
-
Fw × Sv
-
V
Full well capacity
Vertical
Horizontal
Summing
45
60
Fw
120
150
150
200
-
-
ke-
-
CCD node sensitivity
Dark current*8
MPP mode
Readout noise*9
25 °C
0 °C
Sv
4
DS
-
-
Nr
-
5
6
μV/e-
30
300
e-/pixel/s
3
30
4
18
e- rms
Dynamic range*10
Line binning
Area scanning
Photoresponse nonuniformity*11
DR
PRNU
30000
15000
-
37500
18500
±3
-
-
-
-
±10
%
Spectral response range
λ
-
200 to 1100
-
nm
Blemish
Point defect*12 White spots
-
Black spots
-
Cluster defect*13
-
-
Column defect*14
-
-
0
-
-
10
-
-
3
-
-
0
-
*8: Dark current nearly doubles for every 5 to 7 °C increase in temperature.
*9: -50 °C, operating frequency=20 kHz.
*10: Dynamic range = Full well/Readout noise
*11: Measured at one-half of the saturation output (full well capacity) using LED light (peak emission wavelength: 560 nm)
Fixed pattern noise (peak to peak)
Photoresponse nonuniformity =
× 100 [%]
Signal
*12: White spots
Pixels whose dark current is higher than 1 ke- after one-second integration at 0 °C.
Black spots
Pixels whose sensitivity is lower than one-half of the average pixel output. (Measured with uniform light producing one-half of the
saturation charge)
*13: 2 to 9 contiguous defective pixels
*14: 10 or more contiguous defective pixels
3