SSF3341 Datasheet, PDF (3/7 Pages) Silikron Semiconductor Co.,LTD. – Advanced MOSFET process technology

Test Circuits and Waveforms
EAS test circuit:
SSF3341
30V P-Channel MOSFET
Gate charge test circuit:
Switching time test circuit:
Switch Waveforms:
Notes:
①Calculated continuous current based on maximum allowable junction temperature.
②Repetitive rating; pulse width limited by max. junction temperature.
③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
④The value of R_θJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
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Page 3 of 7
Rev.2.2