GS9035C Datasheet, PDF (3/14 Pages) Gennum Corporation – GENLINX II -TM GS9035C Serial Digital Reclocker

AC ELECTRICAL CHARACTERISTICS
V_CC = 5.0V, V_EE = 0V, T_A = 0°C to 70°C unless otherwise stated, R_LF = 1.8K, C_LF1 = 15nF, C_LF2 = 3.3pF
PARAMETER
CONDITION
MIN _TYPICAL¹
MAX
UNITS
NOTES
TEST
LEVEL
Serial Data Rate
SDI
143
-
360
Mb/s
3
Intrinsic Jitter
Psuedorandom (2²³ - 1)
270Mb/s
-
185
See Figure 4 ps p-p
2
4
Intrinsic Jitter
(Pathological SDI checkfield)
270Mb/s
360Mb/s
-
462
See Figure 5 ps p-p
2
3
-
308
Input Jitter Tolerance
270Mb/s
0.40
0.50
-
UI
3
9
360Mb/s
0.38
-
-
UI
3
1
Lock Time Synchronous Switch t_SWITCH < 0.5µs, 270Mb/s
-
1
-
µs
1,4
8
0.5µs < t_SWITCH < 10ms
-
1
-
ms
t_SWITCH > 10ms
-
4
-
ms
Lock Time Asynchronous Switch Loop Bandwidth = 4.5MHz at -
10
360Mb/s
-
ms
1,5
8
SDO MUTE Time
0.5
1
2
µs
6
8
SDO to SCO Synchronization
-200
0
200
ps
8
SDO, SCO Output Signal Swing 75Ω DC load
600
800
1000
mV p-p
1
SDO, SCO Rise and Fall Times 20% - 80%
200
300
400
ps
8
NOTES
1. TYPICAL - measured on EB-RD35A board, T_A = 25°C.
2. Characterized 6 sigma rms.
3. IJT measured with sinusoidal modulation beyond Loop Bandwidth (at 6.5MHz).
4. Synchronous switching refers to switching the input data from one source to another source which is at the same data rate (ie: line 10
switching for component NTSC).
5. Asynchronous switching refers to switching the input data from one source to another source which is at a different data rate.
6. SDO MUTE Time refers to the response of the SDO output from valid re-clocked input data to mute mode when the input signal is removed.
TEST LEVEL
1. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges.
2. Production test at room temperature and nominal supply voltage with guardbands for supply and temperature ranges using correlated
test.
3. Production test at room temperature and nominal supply voltage.
4. QA sample test.
5. Calculated result based on Level 1,2, or 3.
6. Not tested. Guaranteed by design simulations.
7. Not tested. Based on characterization of nominal parts.
8. Not tested. Based on existing design/characterization data of similar product.
9. Indirect test
10.Production test at room temperature.
TEKTRONIX
GIGABERT 1400
CLK DATA
PATTERN 2²³-1
GENNUM CORPORATION
GENNUM
TEST BOARD
DI
SDO
DI
TEKTRONIX CH-1 TRIG
CSA803
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