YA981S6R Datasheet, PDF (4/12 Pages) Fuji Electric – SILICON DIODE

4.TEST AND INSPECTION
4.1 STANDARD TEST CONDITION
Standard test condition is Ta=25ˆɺ65%R.H.
If judgment is no doubt, the test condition is possible to test in normal condition
Ta=5ʙ35ˆɺ48ʙ85%R.H.
4.2 STRUCTURE INSPECTION
It inspect with eye and measure, Item 2 shall be satisfied.
4.3 FORWARD AND REVERSE CHARACTERISTICS
It inspect on the standard condition, Item 3.2 shall be satisfied.
4.4 TEST

Test
No.
Test
items
Testing methods and conditions
Terminal
1 strength
(Tensile)
Terminal
2 strength
(Bending)
Pull force : 10N
Force maintaining duration :10±1s
Load force : 5N
Number of times : 2times(90deg./time)
3
Mounting
strength
Screwing torque value:(M3) : 40±10Nɾcm
4 Vibration
Frequency : 100Hz to 2kHz
Acceleration : 100m/s²
Sweeping time : 4min./1 cycle
4times for each X, Y&Z directions.
Peak amplitude : 15km/s²
5 Shock
Duration time : 0.5ms
3times for each X, Y&Z directions.
Solder : Sn-37Pb
Solder ability 1
Solder temp. : 235ʶ5ˆ
Immersion time : 5ʶ0.5s
6
Apply to flux
Solder : Sn-3Ag-0.5Cu
Solder ability 2
Solder temp. : 245ʶ5ˆ
Immersion time : 5ʶ0.5s
Apply to flux
7
Resistance to
soldering heat
Solder temp. : 260±5°C
Immersion time : 10±1s
Number of times : 1time
Reference
standard
EIAJ
ED4701
EIAJ
ED4701/401
method 1
EIAJ
ED4701/401
method 3
EIAJ
ED4701/402
method 2
EIAJ
ED4701/403
test code D
EIAJ
ED4701/404
test code D

EIAJ
ED4701/303
test code A

Sampling
number
5
5
5
5
5
5
ʵ
5
EIAJ
ED4701/302
5
test code A
Acceptance
number
(0 : 1)
Fuji Electric Device Technology Co.,Ltd.


MS5D3300

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