MC68HC05SR3 Datasheet, PDF (80/96 Pages) Freescale Semiconductor, Inc – High-density Complementary Metal Oxide Semiconductor (HCMOS) Microcontroller Units

11.4
ADC Electrical Characteristics
Table 11-3 ADC Electrical Characteristics for 5V and 3V Operation
CHARACTERISTICS
Resolution
Absolute accuracy
Conversion range
Power-up time
V_RH
V_RL
Conversion time
Monotonicity
Zero-input reading
Full-scale reading
Sample acquisition time
Input capacitance
Input leakage
Notes:
PARAMETER
Number of bits resolved by the ADC
Difference between the actual input voltage and the
full-scale equivalent of the binary code output code for all
errors.⁽¹⁾
Analog input voltage range
ADC power-up time delay, t_ADON
Maximum analog reference voltage
Minimum analog reference voltage
Total time to perform a single analog to digital conversion
(a) External clock (OSC1, OSC2)
(b) Internal RC oscillator
Conversion result never decreases with an increase in
input voltage and has no missing codes
Conversion result when V_IN=V_RL
Conversion result when V_IN=V_RH
Analog input acquisition sampling⁽²⁾
(a) External clock (OSC1, OSC2)
(b) Internal RC oscillator
Input capacitance on AN0-AN3
Input leakage on ADC pins⁽³⁾
AN0, AN1, AN2, AN3, V_RL, V_RH
MINIMUM MAXIMUM UNIT
8
8
bits
—
—
V_RL
—
V_RL
V_SS–0.1
±1.5 (V_DD=5V) LSB
±2 (V_DD=3.3V) LSB
V_RH
V
500
µs
V_DD+0.1
V
V_RH
V
—
32
t_CYC
—
32
t_CYC
Inherent (within total error)
00
—
hex
—
FF
hex
—
12
t_CYC
—
12
µs
—
8
pF
—
±400
nA
(1) Error includes quantization. ADC accuracy may decrease proportionately as V_DD is reduced below 3.0V.
(2) Source impedances greater than 10KΩ adversely affect internal RC charging time during input sampling.
(3) The external system error caused by input leakage current is approximately equal to the product of R source and input current.
11
Freescale
11-4
ELECTRICAL SPECIFICATIONS
TPG
MC68HC05SR3