MRF6S19140HR3 Datasheet, PDF (7/12 Pages) Freescale Semiconductor, Inc – N-Channel Enhancement-Mode Lateral MOSFETs

TYPICAL CHARACTERISTICS
10¹⁰
10⁹
10⁸
10⁷
90 100 110 120 130 140 150 160 170 180 190 200 210
T_J, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere²
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by I_D2 for MTTF in a particular application.
Figure 12. MTTF Factor versus Junction Temperature
N - CDMA TEST SIGNAL
100
0
1.2288 MHz
−10
Channel BW
10
−20
−IM3 @
+IM3 @
1
−30
1.2288 MHz
1.2288 MHz
Integrated BW
Integrated BW
0.1
−40
IS−95 CDMA (Pilot, Sync, Paging, Traffic Codes 8
Through 13) 1.2288 MHz Channel Bandwidth
−50
0.01 _{Carriers. ACPR Measured in 30 kHz Bandwidth @}
−60
±885 kHz Offset. IM3 Measured in 1.2288 MHz
0.001
0.0001
Bandwidth @ ±2.5 MHz Offset. PAR = 9.8 dB @
0.01% Probability on CCDF.
−70
−ACPR @ 30 kHz +ACPR @ 30 kHz
Integrated BW
Integrated BW
−80
0
2
4
6
8
10
−90
PEAK−TO−AVERAGE (dB)
Figure 13. 2 - Carrier CCDF N - CDMA
−100
−7.5 −6 −4.5 −3 −1.5 0 1.5 3 4.5
6 7.5
f, FREQUENCY (MHz)
Figure 14. 2 - Carrier N - CDMA Spectrum
RF Device Data
Freescale Semiconductor
MRF6S19140HR3 MRF6S19140HSR3
7