33883 Datasheet, PDF (4/21 Pages) Freescale Semiconductor, Inc – H-Bridge Gate Driver IC

ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
ELECTRICAL RATINGS
Supply Voltage 1
Supply Voltage 2 ⁽¹⁾
V_CC
V_CC2
-0.3 to 65
V
-0.3 to 35
V
Linear Regulator Output Voltage
V_{LR_OUT}
-0.3 to 18
V
High-Side Floating Supply Absolute Voltage
V_{CP_OUT}
-0.3 to 65
V
High-Side Floating Source Voltage
V_{SRC_HS}
-2.0 to 65
V
High-Side Source Current from CP_OUT in Switch ON State
I_S
250
mA
High-Side Gate Voltage
High-Side Gate Source Voltage ⁽²⁾
V_{GATE_HS}
-0.3 to 65
V
V_{GATE_HS} -
-0.3 to 20
V
V_{SRC_HS}
High-Side Floating Supply Gate Voltage
V_{CP_OUT} -
-0.3 to 65
V
V_{GATE_HS}
Low-Side Gate Voltage
V_{GATE_LS}
-0.3 to 17
V
Wake-Up Voltage
V_{G_EN}
-0.3 to 35
V
Logic Input Voltage
V_IN
-0.3 to 10
V
Charge Pump Capacitor Voltage
V_C1
-0.3 to V_{LR_OUT}
V
Charge Pump Capacitor Voltage
ESD Voltage ⁽³⁾
Human Body Model on All Pins (V_CC and V_CC2 as Two Power
Supplies)
Machine Model
V_C2
V_ESD1
V_ESD2
-0.3 to 65
V
V
±1500
±130
Notes
1. V_CC2 can sustain load dump pulse of 40 V, 400 ms, 2.0 Ω.
2. In case of high current (SRC_HS>100 mA) and high voltage (>20 V) between GATE_HSX and SRC_HS an external zener of 18 V is
needed as shown in Figure 14.
3. ESD1 testing is performed in accordance with the Human Body Model (C_ZAP=100 pF, R_ZAP=1500 Ω), ESD2 testing is performed in
accordance with the Machine Model (C_ZAP = 200 pF, R_ZAP = 0 Ω).
33883
4
Analog Integrated Circuit Device Data
Freescale Semiconductor