33797_11 Datasheet, PDF (30/35 Pages) Freescale Semiconductor, Inc – Four Channel Squib Driver IC

FUNCTIONAL DEVICE OPERATION
PROTECTION AND DIAGNOSIS FEATURES
R_{R_LIMIT_X} = 10 kΩ, I_HS = A ± A
The high side driver controls the current through the squib.
The current limit for the low side driver is only to protect the
low side driver stage from excessive current in the event of a
short to battery.
With R_{R_LIMIT_X} conditions < 4.32 kΩ or shorted to ground,
the current limit will default to the R_{R_LIMIT_X} = 10 kΩ current
limit, not to exceed. With R_{R_LIMIT_X} resistance value > 60 kΩ
or open, the current limit will default to the
R_{R_LIMIT_X} = 10 kΩ maximum current limit.
FET DRIVER CURRENT LIMIT MEASUREMENT
($7X COMMAND)
This function measures the firing current in each squib line
and records the “ON” time in which the I_MEAS is above the
threshold for each squib. (Refer to Dynamic Electrical
Characteristics table, Dynamic Electrical Characteristics.)
The timing registers can be reset via SPI command so
additional current measurements can be made.
An 8-bit message will be used to determine 255 time
steps. The driver current limit measurement is activated when
each individual high side driver is activated. Each time the
squib current is measured above the I_MEAS threshold during
the timer activation, a status bit will be set to “1”. If the current
measured is not above the I_MEAS threshold during the timer
activation, the timing data log bit will not increment. Each
squib timing register can be reset via SPI command so
additional current measurements can be made. Initial squib
IC power-up will reset the timing registers (i.e., “Power-ON
Reset”). When reset, the current limit measurement register
byte will be set to $00.
Command $79 will indicate the status of the current limit
measurement comparator. The current limit measurement
from the test is captured and loaded into the register on the
next valid SPI command. When the firing current is above
I_MEAS, the current limit is activated and the status bit will be
set to “1”. If the firing current is below I_MEAS, the current limit
status bit will be set to “0”.
FET DRIVER CURRENT LIMIT MEASUREMENT
RESET COMMAND ($3X COMMAND)
The current limit status registers can be individually reset
with the command set found in Table 8. When the register bit
is set to “1” for squib X, the current measurement register will
be reset to $00.
SQUIB DRIVER THERMAL SHUTDOWN
($7F COMMAND)
With a nominal squib load, the FET squib driver will not
enter thermal shutdown until the driver has been active for a
minimum of 2.09 ms. The individual squib driver thermal
shutdown will not affect other squib drivers firing “ON” times.
With a shorted squib load, the FET squib driver will not
enter thermal shutdown until the driver has been active for a
minimum of 2.090 ms. For the shorted squib load, the
associated FET squib driver may enter thermal shutdown
with an “ON” time of 2.09 ms ≤ t_ON ≤ 2.82 ms.
When the thermal shutdown limit is exceeded, the thermal
status will be set to “1”. The thermal shutdown status ($7F)
diagnostics latch the thermal bit status when executed. The
Squib Driver Thermal shutdown status latch will be cleared
after the information is transmitted on the next valid SPI
command (i.e., TX: NOP or next $7F, latch cleared on rising
edge of chip select).
The FET squib driver can be activated through the arm / fire
command when the TEMP_RENABLE (MIN) is reached (thermal
shutdown status “0”).
V_TRANTSTX, HIGH AND LOW SIDE SQUIB DRIVER
FET TEST and STATUS ($82 TO $83 COMMAND)
This function checks the squib driver FET transistor status.
The high and low side squib driver FET test requires
FEN_1 and FEN_2 pins to be low and two separate 8-bit write
commands to be made to the shift register. With the FEN_1
and FEN_2 pins status LOW, the first write is to unlock in
preparation of receiving the diagnostic command for testing
the high and low side squib drivers. The unlock command
($82 and $83) is an “AND” function with the FEN_1 and
FEN_2 BAR. All transistor test unlock commands ($82 and
$83) will be echoed back on the SPI Data output.
The high or low side squib driver FET test will be aborted
if firing from any FET is enabled.
During the first write (unlock command), all diagnostic
functions are cleared. After the second write is completed, all
other diagnostic functions are made available again.
Squib 1A, squib 1B, squib 2A, and squib 2B high side
squib drivers will be activated and diagnosed by the $82
followed by $1X diagnostic command (refer to Table 8). A
load from the SQB_HI_XX pin to the SENSE_XX pin is
required for the high side squib driver to be tested.
Squib 1A, squib 1B, squib 2A, and squib 2B low side squib
drivers will be activated and diagnosed by the $83 followed
by $2X diagnostic command (Table 8).
When enabled the high or low side FET driver will be
enabled and current limited to a nominal current limit of
10 mA. The high and low side driver test time is not
automated and is controlled through SPI.
When either a $82 or a $83 command is issued, the
previous transistor test will stop to prevent coinciding high
and low side FET drive transistors from turning “ON”. This
prevents high and low side drivers from being activated
simultaneously.
Note The high or low side squib driver test is capable of
checking a code sequence, allowing any combination of high
or low side drivers to be tested.
The diagnostic squib driver bit (HSDSTAT_X or
LSDSTAT_X) will be set to “1” if the squib driver did not
activate (turn “ON”) during the diagnostic test. The diagnostic
squib driver bit (HSDSTAT_X or LSDSTAT_X) will be set to
“0” if the squib driver did activate (turn “ON”) during the
33797
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Analog Integrated Circuit Device Data
Freescale Semiconductor