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33797_11 Datasheet, PDF (14/35 Pages) Freescale Semiconductor, Inc – Four Channel Squib Driver IC | |||
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V ⤠VDD ⤠5.25 V; 7.0 V ⤠VVFIRE_XX ⤠35 V; VVDIAG_X = VVFIRE_XX;
FEN 1 = FEN 2 = VDD; RR_LIMIT_X = 10 kΩ ±1%, RR_DIAG = 10 kΩ ±1%, -40 °C ⤠TA ⤠+85 °C, GND = 0, unless otherwise noted.
Typical values noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
FET DRIVERS
Turn-On Delay Time
CS â to 80% IHS
tON
µs
â
â
72
Turn-Off Delay Time
CS â to 20% IHS
tOFF
µs
â
â
10
Diagnostic Timing / Resolution
tRESOLUTION
µs
5.0 V ⤠VVDIAG_X ⤠35 V, IHS ⥠IMEAS, 0 s ⤠tMEASURE_TIME ⤠6.375 ms,
CSQUIB_HI = 0.12 µF, CSQUIB_LO = 0.12 µF
21.25
25
28.75
DIAGNOSTIC DELAY TIME
Squib Resistance Diagnostic Delay Time (20)
tDIAG1
From CSB â Until Transistor Test Results Are Valid, CSQUIB_HI = 0.12 µF,
CSQUIB_LO = 0.12 µF
â
Squib Open / Short Diagnostic Delay Time (20)
From CSB â Until Squib Open / Short Diagnostic Results Are Valid,
CSQUIB_HI = 0.12 µF, CSQUIB_LO = 0.12 µF
tDIAG2
â
VDIAG Supply Diagnostic Delay Time From CSB â until VDIAG Diagnostic
Results Are Valid (20)
tDIAG4
â
VFIRE Supply Diagnostic Delay Time (20)
tDIAG6
15 V ⤠VVDIAG_X ⤠35 V, From CSB â Until High Side Safing Sensor
Diagnostic Results Are Valid, CVDIAG < 0.015 µF
â
High Side Safing Sensor Diagnostic Delay Time (20)
tDIAG7
15 V ⤠VVDIAG_X ⤠35 V, From CSB â Until High-Side Safing Sensor
Diagnostic Results Are Valid, CVDIAG < 0.015 µF
â
FET Drivers High and Low Side Driver Transistor Diagnostic Delay Time (20)
tDIAG9
15 V ⤠VVDIAG_X ⤠35 V, From CSB â Until Transistor Test Results Are
Valid, CSQUIB_HI = 0.12 µF, CSQUIB_LO = 0.12 µF, CVDIAG < 0.015 µF
â
VFIRE_RTN Diagnostic Delay Time (20)
From CSB â Until VFIRE_RTN Diagnostic Results Are Valid
tDIAG10
â
Squib Continuity Diagnostic Delay Time (20)
From CSB â Until VTHSQBCON Diagnostic Results Are Valid
tDIAG11
â
Squib Short Between Firing Loops Diagnostic Delay Time From CSB â Until
VTHSSQB Diagnostic Results Are Valid (20)
tDIAG12
â
μs
â
300
μs
â
3000
μs
â
100
μs
â
500
μs
â
500
μs
â
1000
μs
â
300
μs
â
3000
μs
â
3000
FEN INPUT PIN
Minimum Pulse Width
Notes
20 Guaranteed by Characterization
FENFILTER
12
14
16
μs
33797
14
Analog Integrated Circuit Device Data
Freescale Semiconductor
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