56F8355_09 Datasheet, PDF (152/172 Pages) Freescale Semiconductor, Inc – 16-Bit Digital Signal Controllers

Table 10-23 ADC Parameters (Continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Conversion time
t_ADC
—
6
—
t_AIC cycles³
Sample time
t_ADS
—
1
—
t_AIC cycles³
Input capacitance
C_ADI
—
5
—
pF
Input injection current⁵, per pin
I_ADI
—
—
3
mA
Input injection current, total
I_ADIT
—
—
20
mA
V_REFH current
I_VREFH
—
1.2
3
mA
ADC A current
I_ADCA
—
25
—
mA
ADC B current
I_ADCB
—
25
—
mA
Quiescent current
I_ADCQ
—
0
10
μA
Uncalibrated Gain Error (ideal = 1)
E_GAIN
—
+/- .004
+/- .015
—
Uncalibrated Offset Voltage
V_OFFSET
—
+/- 15
+/- 35
mV
Calibrated Absolute Error⁶
AE_CAL
—
See Figure 10-22
—
LSBs
Calibration Factor 1⁷
CF1
—
TBD
0.010380
—
Calibration Factor 2⁷
CF2
—
TBD
-31.7
—
Crosstalk between channels
—
—
-60
—
dB
Common Mode Voltage
V_common
—
(V_REFH - V_REFLO) / 2
—
V
Signal-to-noise ratio
SNR
—
64.6
—
db
Signal-to-noise plus distortion ratio
SINAD
—
59.1
—
db
Total Harmonic Distortion
THD
—
60.6
—
db
Spurious Free Dynamic Range
SFDR
—
61.1
—
db
Effective Number Of Bits⁸
ENOB
—
9.6
—
Bits
Non-averaged DC drift of error over
—
—
—
temperature from 27° C⁹
3
LSB
1. INL measured from V_in = .1V_REFH to V_in = .9V_REFH
10% to 90% Input Signal Range
2. LSB = Least Significant Bit
3. ADC clock cycles
4. Assumes each voltage reference pin is bypassed with 0.1μF ceramic capacitors to ground
5. The current that can be injected or sourced from an unselected ADC signal input without impacting the performance of
the ADC. This allows the ADC to operate in noisy industrial environments where inductive flyback is possible.
6. Absolute error includes the effects of both gain error and offset error.
7. Please see the 56F8300 Peripheral User’s Manual for additional information on ADC calibration.
8. ENOB = (SINAD - 1.76)/6.02
9. Temperature range –40° C to 150° C
56F8355 Technical Data, Rev. 17
152
Freescale Semiconductor
Preliminary