33784 Datasheet, PDF (14/30 Pages) Freescale Semiconductor, Inc – DSI 2.02 Sensor Interface

FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
INPUT / OUTPUT PINS
There are three I/O pins on the 33784 that can serve as
either logic inputs or logic outputs. At power-up or after a
Clear Command, the pins default to inputs. They can be
individually configured as outputs as needed via the I/O
Control Command on the bus.
Table 5. 10-Bit ADC Value Mapping
Hex
03FF
•
•
•
03F9
03F8
03F7
•
•
•
03E4
03E3
•
•
•
0020
001F
•
•
•
0000
Description
Prohibited
•
•
•
Prohibited
Error Code
Prohibited
•
•
•
Prohibited
G Range
•
•
•
G Range
Prohibited
•
•
•
Prohibited
Table 6. 8-Bit ADC Value Mapping
Hex
Description
FF
Prohibited
FE
Error Code
FD
Prohibited
•
•
•
•
•
•
Table 6. 8-Bit ADC Value Mapping
Hex
Description
FA
Prohibited
F9
Prohibited
F8
G Range
•
•
•
•
•
•
08
G Range
07
Prohibited
•
•
•
•
•
•
02
Prohibited
01
Prohibited
00
Prohibited
ADDRESSING
The 33784 may be connected in a daisy chain to other
DBUS devices. If this device is connected in a daisy chain,
then it will receive its 4-bit address during initialization on the
bus.
TEST MODE
The 33784 can be configured in a special test mode for
evaluation purposes. The test mode can only be entered if all
of the following conditions are true:
• The TEST1 pin is at a logic high level
• The correct test mode command is sent to the device on
the bus
• One of the internal test mode registers is accessed
Accessing the test mode registers and writing different
values to them can change the behavior of many of the pins
on the device, including the TOUT pin, which is only active in
test mode. The test mode can be intermixed with other bus
commands to evaluate the behavior of internal circuit blocks.
To prevent accidental activation of the test mode, the
TEST1 pin should be tied externally to AGND. The TOUT pin
should be grounded when not in TEST mode.
33784
14
Analog Integrated Circuit Device Data
Freescale Semiconductor