U054BT2510 Datasheet, PDF (7/7 Pages) Formosa MS – SMD Ultra Low Capacitance ESD Protection Array

SMD Ultra Low Capacitance ESD Protection Array
U054BT2510
High reliability test capabilities
Item Test
1. Solder Resistance
Conditions
at 260±5^OC for 10±2sec.
2. Solderability
at 245±5^OC for 5 sec.
3. High Temperature Reverse Bias
V_BR= V_BR Min * 80% at T_J=125^OC for 168 hrs.
4. Pressure Cooker
5. Temperature Cycling
15P_SIG at T_A=121^OC for 4 hrs.
-55^OC to +125^OC dwelled for 30 min.
and transferred for 5min. total 10 cycles.
6. Humidity
7. High Temperature Storage Life
at T_A=85^OC, RH=85% for 1000hrs.
at 175^OC for 1000 hrs.
Formosa MS
Reference
MIL-STD-750D
METHOD-2031
MIL-STD-202F
METHOD-208
MIL-STD-750D
METHOD-1038
JESD22-A102
MIL-STD-750D
METHOD-1051
MIL-STD-750D
METHOD-1021
MIL-STD-750D
METHOD-1031
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Page 7
Document ID Issued Date
DS-221822 2016/04/19
Revised Date Revision
-
A
Page.
7