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FMBT3904W Datasheet, PDF (11/11 Pages) Formosa MS – SMD NPN Transistor | |||
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SMD NPN Transistor
FMBT3904W
High reliability test capabilities
Item Test
Conditions
1. Steady State Operating Life
PD=150mW Test Duration:1000hrs
Formosa MS
2. High Temperature Reverse Bias
3. Temperature Cycle
4. Autoclave
Tj= 150â, V = CE 80% related volage, 1000hrs
-55â( 15min) to 150â( 15min)Air to Air Transition Time< 20sec Test Cycles:1000cycle
P=2atm Ta=121â RH=100% Test Duration:96hrs
5. High Temperature Storage Life
Ta=150â Test Duration:1000hrs
6. Solderability
245â,5sec
7. High Temperature High Humidity Reverse
Bias
Ta= 85â, 85% RH, V = CE 80% related volage, 1000hrs
8. Resistance to Soldering Heat
260â,10sec
http://www.formosams.com/
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FAX:886-2-22696141
Page 11
Document ID Issued Date
DS-231120 2008/02/10
Revised Date Revision
2010/03/10
B
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11
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