SCAN18541T Datasheet, PDF (9/11 Pages) National Semiconductor (TI) – Non-Inverting Line Driver with TRI-STATE Outputs

AC Operating Requirements
Scan Test Operation:
V_CC
T_A = +25°C
T_A = −40°C to +85°C
Symbol
Parameter
(V)
C_L = 50 pF
C_L = 50 pF
Units
(Note 10)
Guaranteed Minimum
t_S
Setup Time, H or L
Data to TCK (Note 11)
5.0
3.0
3.0
ns
t_H
Hold Time, H or L
TCK to Data (Note 11)
5.0
4.5
4.5
ns
t_S
Setup Time, H or L
AOE _n, BOE_n to TCK (Note 12)
t_H
Hold Time, H or L
TCK to AOE_n, BOE_n (Note 12)
t_S
Setup Time, H or L
Internal AOE, BOE, to TCK (Note 13)
5.0
3.0
5.0
4.5
5.0
3.0
3.0
ns
4.5
ns
3.0
ns
t_H
Hold Time, H or L
TCK to Internal AOE, BOE (Note 13)
5.0
3.0
3.0
ns
t_S
Setup Time, H or L
TMS to TCK
5.0
8.0
8.0
ns
t_H
Hold Time, H or L
TCK to TMS
5.0
2.0
2.0
ns
t_S
Setup Time, H or L
TDI to TCK
5.0
4.0
4.0
ns
t_H
Hold Time, H or L
TCK to TDI
5.0
4.5
4.5
ns
t_W
Pulse Width TCK
5.0
H
15.0
15.0
ns
L
5.0
5.0
f_MAX
Maximum TCK
Clock Frequency
5.0
25
25
MHz
T_PU
Wait Time, Power Up
to TCK
5.0
100
100
ns
T_DN
Power Down Delay
0.0
100
Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK.
100
ms
Note 10: Voltage Range 5.0 is 5.0V ± 0.5V.
Note 11: This delay represents the timing relationship between the data input and TCK at the associated scan cells numbered 0-8, 9-17, 18-26 and 27-35.
Note 12: Timing pertains to BSR 37, 38, 40 and 41 only.
Note 13: This delay represents the timing relationship between AOE/BOE and TCK for scan cells 36 and 39 only.
9
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