FSA3200 Datasheet, PDF (8/13 Pages) Fairchild Semiconductor – Two-Port, High-Speed USB2.0 Switch with Mobile High-Definition Link (MHL™)

Test Diagrams
Note:
14. HSD refers to the high-speed data USB or MDV paths.
V_ON
HSD_n
V_{S W}
GND
Dn
Select
I_ON
GND
R_{O = VO / ION} ^{VSel= 0 or VC}
Figure 4. On Resistance
GND
Figure 6. AC Test Circuit Load
Input
0V
50%
t_PLH
Output
50%
50%
400mV
t_PHL
50%
V_OH
V_OL
Figure 8. Propagation Delay (t_Rt_F – 500 ps)
NC
I_Dn(OFF)
A
V_SW
Select
GND
V_Sel= 0 orVcc
**Each switch port is tested separately
Figure 5. Off Leakage
t_RISE = 2.5ns
t_FALL = 2.5ns
V_CC
Input – V_SEL1, V_SEL
GND
10%
V_OH
Output- V_OUT
VOL
90%
V_CNTRL-HI
90 %
V_{CNTRL-HI 10%}
90%
90%
t_ON
t_OFF
Figure 7. Turn-On / Turn-Off Waveforms
t_{RISE= 500ps}
t_{FALL = 500ps}
+400mV
- 400mV
10%
90%
0V
90%
10%
Output
t _PHL
t _PLH
Figure 9. Intra-Pair Skew Test t_SK(P)
© 2010 Fairchild Semiconductor Corporation
FSA3200 • Rev. 1.0.8
8
www.fairchildsemi.com